2000
DOI: 10.1016/s0040-6090(00)00700-8
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InAs quantum dots embedded in silicon

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Cited by 19 publications
(14 citation statements)
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“…Excess indium is likely to segregate and form macroscopic indium droplets. This has been observed on Si (001) by Hansen et al with As 4 /In BEP ratio of around 3 [26], although we do not observed this phenomena using similar growth conditions with our system. For InAs grown on GaAs substrate, low arsenic pressure may completely suppress the dot formation [20].…”
Section: Resultssupporting
confidence: 74%
“…Excess indium is likely to segregate and form macroscopic indium droplets. This has been observed on Si (001) by Hansen et al with As 4 /In BEP ratio of around 3 [26], although we do not observed this phenomena using similar growth conditions with our system. For InAs grown on GaAs substrate, low arsenic pressure may completely suppress the dot formation [20].…”
Section: Resultssupporting
confidence: 74%
“…SAQDs consist of only a few monolayers (MLs) of the active materials, allowing the integration of materials with large lattice mismatch without dislocation. One of such materials combination is InAs SAQD on Si [4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…Formation of InAs QDs embedded in silicon matrix at a substrate temperature of 370 1C has been observed by RHEED after deposition of 1.7MLs of InAs independent of the As/In flux ratio [2]. In addition, the thermal mismatch caused by the different thermal expansion coefficients of III-V film and substrate, results in an additional strain by cooling down the material from growth to room temperature.…”
Section: Introductionmentioning
confidence: 96%
“…The luminescence efficiency of an indirect gap matrix can be dramatically improved by inserting a narrow and a direct-gap material like InAs or InGaAs in silicon matrix. So far, only few details on the growth mechanism of InAs on silicon substrates have been provided in literature [2,10]. In this contribution, we concentrate on basic growth studies addressing mainly morphological properties of quantum-dot like structures grown directly on silicon surfaces with a main emphasis on surface preparation and growth parameters.…”
Section: Introductionmentioning
confidence: 99%