Indirect Measurement Method for S-Parameters with a Recursive Procedure

Maeda, Noboru; Fukui, Shinji; Sekine, Toshikazu; Takahashi, Yasuhiro

doi:10.1109/isemc.2019.8825255

Cited by 1 publication

(2 citation statements)

References 8 publications

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“…In addition, it influences the magnitude and the phase of the differential voltage. The ambiguity of the sign could be resolved by a solution proposed in [10]. Which is not envisaged in our study, since it requires adding an extra known connection between the direct and the indirect ports.…”

Section: Estimation Of Saumentioning

confidence: 97%

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Fast and efficient approach to predict EMC immunity of complex equipment after a component change

Chetouani¹,

Serpaud²,

Boyer

et al. 2020

2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

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This paper describes a fast methodology for managing the obsolescence issues of components in industrial equipment (aeronautical and/or automotive). The objective is to predict Electromagnetic Compatibility (EMC) non-compliance risk or guarantee a non-regression of EMC performances, in conducted immunity, after a component change. This could be achieved through an equivalent test at the component level if the residual voltage at its pins could be estimated. Accordingly, this approach aims to decline conducted immunity requirements, from the connector at the input of an equipment to an obsolete component placed on one of its boards. Which must constitute a faster and cheaper solution than systematic EMC qualification test of the equipment each time a component is replaced.

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Section: Estimation Of Saumentioning

confidence: 97%

“…Estimating the Sau matrix is the most complex part. The authors of this technique have proposed different methods [8] [9] [10]. We present in this part, the easiest one to use and we mention the references of the others, which are more mathematically complicated.…”

Section: Estimation Of Saumentioning

confidence: 99%