2016
DOI: 10.1063/1.4962658
|View full text |Cite
|
Sign up to set email alerts
|

Induced conductivity in sol-gel ZnO films by passivation or elimination of Zn vacancies

Abstract: Undoped and Ga-and Al-doped ZnO films were synthesized using sol-gel and spin coating methods and characterized by X-ray diffraction, high-resolution scanning electron microscopy (SEM), optical spectroscopy and Hall-effect measurements. SEM measurements reveal an average grain size of 20 nm and distinct individual layer structure. Measurable conductivity was not detected in the unprocessed films; however, annealing in hydrogen or zinc environment induced significant conductivity (∼10 −2 Ω.cm) in most films. Po… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
19
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 32 publications
(20 citation statements)
references
References 35 publications
1
19
0
Order By: Relevance
“…We should consider the possible role of grain boundaries on inducing FM, as our structural characterization of the solgel-doped ZnO films [24] indicates a small grain size of about 20 nm. According to a previous work by Hsu et al [38], FM occurs in polycrystalline ZnO films at high grain boundary densities.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…We should consider the possible role of grain boundaries on inducing FM, as our structural characterization of the solgel-doped ZnO films [24] indicates a small grain size of about 20 nm. According to a previous work by Hsu et al [38], FM occurs in polycrystalline ZnO films at high grain boundary densities.…”
Section: Resultsmentioning
confidence: 99%
“…The films were then annealed in air at 500 or 700°C to form a ZnO structure. More details concerning the synthesis of ZnO films by the sol-gel method and their structural characterization can be found in [24].…”
Section: Methodsmentioning
confidence: 99%
“…Although there is a lack of ZnO phase formation for ZnO 4 on Kapton and an impurity phase for ZnO 3 on TOPAS, Figure 5. XRD measurements for AZO films annealed in various atmospheres [21].…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…Although light from the LED produces localized heating, Table 3. Van der Pauw and Hall effect measurements for ZnO, AZO, GZO, and IGZO thin films grown from ZnO solgel precursors, listing the film type, post-processing conditions, resistivity, mobility, and carrier concentration [20,21].…”
Section: Photoconductivitymentioning
confidence: 99%
See 1 more Smart Citation