“…44 We use a In the survey wide scan peaks were found, which confirms the absence of any foreign element in our samples. The survey spectra of the difference between core level spectra (HR spectra) of Si 2p, as Si 2p 3/2 and 2p 1/2 , corresponding to 99.47 eV and 100.13 eV for the n 30 sample, and on the other hand, 99.51 eV and 100.16 eV, for the p 30 sample, assigned to Si-Si 45 clearly show the presence of the Si (0) oxidation state in the grown NWs for both samples, respectively, which also supports the previous reported results of Si NWs. 11,46 Moreover, the peak shifting in BE (eV) between Si 2p 3/2 and 2p 1/2 was D = 0.6 eV.…”