1982
DOI: 10.1143/jjap.21.l263
|View full text |Cite
|
Sign up to set email alerts
|

Inelastic Low Energy Electron Diffraction Measurements of Hydrogen Adsorbed Si (001) Surfaces: 2×1:H and 1×1: :2H

Abstract: To date, various connection rerouting methods for connection-oriented mobile networks have been proposed. The previous methods, however, are limited to specific topologies or environments. In this paper, we propose the connection-information-based rerouting widely applicable to various connection-oriented mobile networks. This method requires neither a specific topology nor a complex connection, enables fast rerouting, provides appropriate route optimality, and can be extended easily.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

1982
1982
1993
1993

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 23 publications
(2 citation statements)
references
References 9 publications
0
2
0
Order By: Relevance
“…The chemisorption of hydrogen on Si-(100)-2 X 1 has been investigated by EELS, AES, and TD (565). Hydrogen-adsorbed Si(100)-1 X 1 surfaces have been probed by ISS with the conclusion that the surface is relaxed inward over a distance of approximately 0.08 A or about 6% of the interplanar distance (920), and hydrogen-adsorbed Si(001)-1 X 1 and -2X1 surfaces have been studied by inelastic LEED (587). SIMS was used to obtain profiles of hydrogen, carbon, nitrogen, and oxygen absorbed into evaporated amorphous silicon films after air exposure (570).…”
Section: Semiconductorsmentioning
confidence: 99%
“…The chemisorption of hydrogen on Si-(100)-2 X 1 has been investigated by EELS, AES, and TD (565). Hydrogen-adsorbed Si(100)-1 X 1 surfaces have been probed by ISS with the conclusion that the surface is relaxed inward over a distance of approximately 0.08 A or about 6% of the interplanar distance (920), and hydrogen-adsorbed Si(001)-1 X 1 and -2X1 surfaces have been studied by inelastic LEED (587). SIMS was used to obtain profiles of hydrogen, carbon, nitrogen, and oxygen absorbed into evaporated amorphous silicon films after air exposure (570).…”
Section: Semiconductorsmentioning
confidence: 99%
“…Furthermore, since the adsorbed hydrogen is known to desorb from the surfaces at low temperatures (below 500*C and below 200*C for Si(100) and Ge(100), respectively), the hydrogen-terminated surface can be particularly useful in low temperature processing. [4,5,6] The structural and electronic properties for the H-chemisorbed surface of Si(100) and Ge(100) have been characterized for many years. It is well known that when a clean surface of Si(100) is exposed to atomic hydrogen, three different surface structures are observed which are characterized by 2xl, 3x1 and lxl Low Energy Electron Diffraction (LEED) patterns.…”
Section: Introductionmentioning
confidence: 99%