2011
DOI: 10.1143/jjap.50.031004
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Influence of a GaN Cap Layer on the Morphology and the Physical Properties of Embedded Self-Organized InN Quantum Dots on GaN(0001) Grown by Metal–Organic Vapour Phase Epitaxy

Abstract: Self-organized InN quantum dots were grown on GaN(0001) by metal–organic vapour phase epitaxy. Transmission electron microscopy (TEM) measurements found no wetting layer, i.e., the dots grow directly in Volmer–Weber growth mode. The dots were capped with GaN by three different procedures. Direct overgrowth at the same temperature as the dot formation produced the smoothest surfaces. Cubic and hexagonal GaN was observed in the cap layer, as well as strong indium intermixing. The dot size and volume was reduced … Show more

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Cited by 9 publications
(9 citation statements)
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“…In addition, the critical thickness of the wetting layer for the formation of QD-like centers decreases when the indium composition of the InGaN layer increases [19,20]. Kobayashi reported an S-K growth mode InGaN layer of 50% indium without the formation of QDs on SiC substrate [21], but it was also reported that strained QDs were observed after a 0.9 monolayer (ML) was grown when growing InN on a GaN substrate [22,23]. We think it may be possible for the growth mode to change from the S-K growth mode to a complete V-W growth mode when the indium composition in InGaN increases from 50% to 100%.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, the critical thickness of the wetting layer for the formation of QD-like centers decreases when the indium composition of the InGaN layer increases [19,20]. Kobayashi reported an S-K growth mode InGaN layer of 50% indium without the formation of QDs on SiC substrate [21], but it was also reported that strained QDs were observed after a 0.9 monolayer (ML) was grown when growing InN on a GaN substrate [22,23]. We think it may be possible for the growth mode to change from the S-K growth mode to a complete V-W growth mode when the indium composition in InGaN increases from 50% to 100%.…”
Section: Resultsmentioning
confidence: 99%
“…The majority of InN QD growth to date has been conducted with TMIn 26,44,[48][49][50][51][52][53] . A few studies have been conducted on InN QDs which were grown using TEIn 27,54 .…”
Section: Group III Precursorsmentioning
confidence: 99%
“…The most common growth plane for III-nitride optoelectronics is the (0001) plane, also known as the c-plane or the metal-polar orientation. InN QDs are no exception, with the majority of studies being on metal-polar GaN 26,27,[49][50][51][52]54 . In this orientation, spontaneous and piezoelectric polarization typically have strong effects which depend on the composition and strain state of the material 66 .…”
Section: Metal-polar or (0001)mentioning
confidence: 99%
“…27 Considering the formation and the relaxation of GaN 3D islands we obtain a good fit to the a-lattice spacing evolution. However, the formation of strained or unstrained (In,Ga)N might also occur during capping by GaN, 28 although the presence of (In,Ga)N alone does not allow to properly fit the data.…”
mentioning
confidence: 99%