2018
DOI: 10.1080/03772063.2018.1433078
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Influence of Carrier–Carrier Interactions on the Noise Performance of Millimeter-Wave IMPATTs

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Cited by 8 publications
(9 citation statements)
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“…The opencircuit condition without any applied high-frequency AC voltage signal was considered for the small-signal avalanche noise simulation [73]. Two second-order differential equations corresponding to the real and imaginary parts of the noise field were simultaneously solved, subject to appropriate boundary conditions, by using the Runge-Kutta method in order to obtain the noise field distribution along the depletion layer [74]. Here, band-to-band tunneling is considered as a noiseless instantaneous process.…”
Section: Simulation Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The opencircuit condition without any applied high-frequency AC voltage signal was considered for the small-signal avalanche noise simulation [73]. Two second-order differential equations corresponding to the real and imaginary parts of the noise field were simultaneously solved, subject to appropriate boundary conditions, by using the Runge-Kutta method in order to obtain the noise field distribution along the depletion layer [74]. Here, band-to-band tunneling is considered as a noiseless instantaneous process.…”
Section: Simulation Methodsmentioning
confidence: 99%
“…Here, band-to-band tunneling is considered as a noiseless instantaneous process. This noise simulation method is known as the DIFM method [73,74]. Finally, from the knowledge of the mean square noise current and voltage, the transfer noise impedance at each space point of the depletion layer was calculated.…”
Section: Simulation Methodsmentioning
confidence: 99%
“…The simulation involved the simultaneous solution of two second-order differential equations representing the real and imaginary parts of the noise field, while adhering to appropriate boundary conditions. This computational approach employed the Runge-Kutta method and was designed to determine the noise field distribution along the depletion layer [38]. Notably, the band-to-band tunneling process was regarded as a noiseless instantaneous event, characterizing this noise simulation methodology as the DIFM method [37,38].…”
Section: Simulation Techniquementioning
confidence: 99%
“…The noise simulation of the mutually injection locked ten-element G-IMPATT sources have also been carried out at small-signal condition. 49 The equivalent circuit for avalanche noise simulation is shown in Figure 14, in which the diode impedances are replaced by noise sources v i ð Þ n , i = 1,2,3,:…, N . The noise measure vs frequency plots presented in Figure 15 show that the mutual injection locking causes slight increase in noise measure especially at higher operating F I G U R E 1 2 Variations of overall resistance and reactance of the ten-element 1.0 THz G-IMPATT source without injection locking and with mutual injection locking, with frequency for active layer length mismatch parameter varying in between ±10% F I G U R E 1 3 Variations of RF power output of the ten-element G-IMPATT sources without injection locking and with mutual injection locking, with frequency for active layer length mismatch parameter varying in between ±10%…”
Section: F I G U R Ementioning
confidence: 99%
“…The noise simulation of the mutually injection locked ten‐element G‐IMPATT sources have also been carried out at small‐signal condition 49 . The equivalent circuit for avalanche noise simulation is shown in Figure 14, in which the diode impedances are replaced by noise sources vni,0.36emi=1,2,3,.,N.…”
Section: Characteristicsmentioning
confidence: 99%