“…Hildebrand and Rüegsegger [99] highlight additional parameters useful for characterising lattice structures with XCT, for example the ratio of surface area to volume which could allow for a comparison of attached particles in multiple samples. Dimensional measurements have been performed using XCT [98,100], SEM [11,13,68,69,73,[85][86][87][101][102][103] and optical microscopy [25,36,63,75,76,[104][105][106]. It is also relatively common to use Vernier callipers for the measurement of outer dimensions (for example, lattice diameter, length, width) [74,103,104,107].…”