A configuration of misfit dislocation dipoles is observed in a Ga 0.5 In 0.5 P heterostructure grown by solid-source molecular-beam epitaxy on GaAs. The dipole dislocations are mostly of 60°type, separated by ϳ3.5 nm. The dislocations are not produced by conventional lattice mismatch, rather, they could be the result of lateral compositional modulation in the Ga 0.5 In 0.5 P epilayer.