1981
DOI: 10.1364/ao.20.002742
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Infrared optical properties of evaporated alumina films

Abstract: The dielectric function epsilon identical with epsilon(1) + iepsilon(2) has been determined for Al(2)O(3) films prepared by electron beam evaporation, in the 5-50-microm wavelength range. The data were extracted from spectrophotometric recordings of transmittance and reflectance by use of a novel technique. Supplementary measurements were made of the refractive index for visible and near-infrared wavelengths and of the dielectric constant at 1 MHz. Kramers-Kronig analysis was employed to check the consistency … Show more

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Cited by 121 publications
(48 citation statements)
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“…We estimated d on the basis of optical interference theory as follows: n2dcosβ = (2 m + 1) λ/4, (m = 0, 1, 2…). 13 In this equation, λ is the peak emission wavelength of rhodamine B and β is the refraction angle against α at the air-Al2O3 interface, as calculated from Snell's law with the refractive indices n1 (air) and n2 (Al2O3) assumed to be 1 and 1.62, 21 respectively. The presence of the rhodamine B layer was ignored because its thickness was expected to be sufficiently less.…”
Section: Design Of the Al2o3 Thicknessmentioning
confidence: 99%
“…We estimated d on the basis of optical interference theory as follows: n2dcosβ = (2 m + 1) λ/4, (m = 0, 1, 2…). 13 In this equation, λ is the peak emission wavelength of rhodamine B and β is the refraction angle against α at the air-Al2O3 interface, as calculated from Snell's law with the refractive indices n1 (air) and n2 (Al2O3) assumed to be 1 and 1.62, 21 respectively. The presence of the rhodamine B layer was ignored because its thickness was expected to be sufficiently less.…”
Section: Design Of the Al2o3 Thicknessmentioning
confidence: 99%
“…The dispersion of the index of refraction with wavelength is included for all materials used. However, for the thin amorphous alumina layer on top of the mirrors a constant value of n = 1.6 was assumed, which is an approximation of the value in the studied region ([500−900] nm, Eriksson et al 1981). 2.…”
Section: Modeling Approachmentioning
confidence: 99%
“…From our previous results, it was possible to estimate the optimal Al2O3 thickness on the basis of OI theory: n2dcos θ2 = (2m + 1)λ/4, (m = 0, 1, 2…). 23 The refractive indices, n1 of air and n2 of Al2O3, were assumed to be 1 and 1.62, 32 respectively. When the incident angle, θ1, was assumed to be 0 , the refraction angle, θ2, was calculated from Snell's law.…”
Section: Design Of the Al2o3 Thicknessmentioning
confidence: 99%