2013
DOI: 10.1117/12.2039156
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InSb photodetectors with PIN and nBn designs

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Cited by 11 publications
(11 citation statements)
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“…Such devices are anticipated to be reconfi gurable at GHz time scales and capable of mimicking nearly all linear refractive and diffractive optical elements. Heterojunction devices using InSb and InAlSb layers, (infrared detectors, [ 55,64 ] LEDs, [ 65,66 ] transistors, [ 58,67,68 ] etc.) similar to the proposed structure have been demonstrated with comparable device characteristics.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Such devices are anticipated to be reconfi gurable at GHz time scales and capable of mimicking nearly all linear refractive and diffractive optical elements. Heterojunction devices using InSb and InAlSb layers, (infrared detectors, [ 55,64 ] LEDs, [ 65,66 ] transistors, [ 58,67,68 ] etc.) similar to the proposed structure have been demonstrated with comparable device characteristics.…”
Section: Discussionmentioning
confidence: 99%
“…At all voltages, we assume an Auger-limited lifetime of 135 ps, a value consistent with studies of optically pumped InSb. [ 51,53 ] We use worst-case values of reported carrier lifetimes [53][54][55][56] and mobilities [ 52,57,58 ] at high carrier concentrations to identify phenomena that do not rely on optimistic input parameters. These recombination processes enable high-speed GHz operation (subject to suitable RC time constants) in the high injection forward bias scheme.…”
Section: Full Paper Full Paper Full Papermentioning
confidence: 99%
“…Using the HgCdTe benchmark known as Rule 07, we compare the experimental data for barrier detectors with a simple empirical relationship that describes the dark current behavior of HgCdTe photodiodes with temperature and wavelengths. [17][18][19][20][21] The cut-off wavelength was taken as the point of a 50% response. Figure 5 shows the dark current density in MWIR barrier detectors published in the literature for comparison with Rule 07.…”
Section: Comparison With Experimental Datamentioning
confidence: 99%
“…1, a. Как при U < 0, так и при U > 0 по мере увеличения смещения возникает резкий рост тока по абсолютной величине (вставка на рис. 1, а), однако для положительной и отрицательной областей этот рост начинается при разных смещениях: • 10 −6 −10 −2 A/cm 2 ) в nBn-гетероструктуре меньше, чем плотность тока в типичных pin-структурах ( j = 5 • 10 −5 − 1 A/cm 2 ) в том же диапазоне температур при U = −50 mV [8]. Понижение плотности тока показывает, что внедренный барьер блокирует часть основных носителей заряда и тем самым понижает плотность темнового тока.…”
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