Extended Abstracts of the 1994 International Conference on Solid State Devices and Materials 1994
DOI: 10.7567/ssdm.1994.pa-1-5
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Intelligent Power IC with Partial SOI Structure

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Cited by 2 publications
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“…Thick SOI technology using a bonded SOI wafer and trench isolation has been proposed in early 1990's [13], and some power and/or high-voltage ICs using this technology have been developed [1][2][3][4][5][6][7][8]. Figure 5 illustrates schematic cross section of our PDP scan driver IC products on thick SOI.…”
Section: Thick Soi Technologymentioning
confidence: 99%
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“…Thick SOI technology using a bonded SOI wafer and trench isolation has been proposed in early 1990's [13], and some power and/or high-voltage ICs using this technology have been developed [1][2][3][4][5][6][7][8]. Figure 5 illustrates schematic cross section of our PDP scan driver IC products on thick SOI.…”
Section: Thick Soi Technologymentioning
confidence: 99%
“…Thick SOI technology has become an important isolation technology in power and/or high-voltage ICs, for example automotive power ICs [1,2] and PDP driver ICs [3][4][5][6][7][8]. This is because 1) high-voltage and high-current devices can be integrated and 2) almost no parasitic devices and very small isolation area can be realized by combining with trench technique.…”
Section: Introductionmentioning
confidence: 99%
“…The intelligent power IC that contains the logic circuits and the power elements on the same chip has the growing demand in the automotive application. The ideal substrate structure for the intelligent power IC is the partial SOI structure (3,4) shown in figure 1, because it can integrate the control circuits in the dielectrically isolated SOI region and the low on-state resistance vertical power element for more current capability in the non-SOI region (5). As a fabrication method, we have previously proposed the direct bonding combined with the technology of filling oxide in the cavity by oxidation (1).…”
Section: Partial Soi Structurementioning
confidence: 99%