2009
DOI: 10.1103/physrevb.80.125422
|View full text |Cite
|
Sign up to set email alerts
|

Interference effect on Raman spectrum of graphene onSiO2/Si

Abstract: The intensity ratio between two major Raman bands in graphene is one of the most important information for physics of graphene and has been believed to represent various intrinsic properties of graphene without critical assessment of extrinsic effects. We report a micro Raman spectroscopy study on the Raman intensity ratio of the 2D band to the G Raman band of graphene varying the thickness of dielectric layers (SiO 2 ) underneath it. The ratio is shown to change by almost 370% when the thickness is varied by … Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

9
217
1
2

Year Published

2012
2012
2022
2022

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 288 publications
(229 citation statements)
references
References 37 publications
9
217
1
2
Order By: Relevance
“…Graphene on hBN is closest to the undoped region of the plot, followed by OTS, SiO 2 , and finally Al 2 O 3 at the more highly doped region. (Although the peak intensities on Al 2 O 3 have not been corrected for optical interference effects from the different substrate, 42 the peak positions are accurate.) After diazonium functionalization, the data points from all substrates move further along the doping trend line.…”
Section: Analysis Of Raman Spectroscopic Mapsmentioning
confidence: 99%
“…Graphene on hBN is closest to the undoped region of the plot, followed by OTS, SiO 2 , and finally Al 2 O 3 at the more highly doped region. (Although the peak intensities on Al 2 O 3 have not been corrected for optical interference effects from the different substrate, 42 the peak positions are accurate.) After diazonium functionalization, the data points from all substrates move further along the doping trend line.…”
Section: Analysis Of Raman Spectroscopic Mapsmentioning
confidence: 99%
“…First, it provides some interference-based enhancement in the SLG absorption [84][85][86][87]. Fig.12a plots the exposed SLG absorption for the system described in Fig.1 on top of a 300nm SiO 2 /Si substrate.…”
Section: Sio2/si Substrate Effectsmentioning
confidence: 99%
“…[10][11][12][13][14][15][16] Nevertheless, most techniques rely on the specific properties of 2D materials. For example, one can identify the layer number, denoted as N, of MoS 2 by the intensity or peak positions of the corresponding photoluminescence (PL) peak and Raman modes.…”
mentioning
confidence: 99%
“…However, the alloy flakes with the same layer number exhibit the C modes with almost the same frequency, in spite of the significant peak intensity due to the optical interference effect in the MoWS 2 /SiO 2 /Si multilayer. 13,16 Alloy flakes with different layer number display disparate C modes, offering a reliable diagnostic of the layer number. Similar behavior has also been observed for the LB modes (not shown here).…”
mentioning
confidence: 99%