Soft x-ray resonant magnetic scattering ͑SXRMS͒ has been used to probe the interlayer coupling in amorphous ferromagnetic/semiconductor multilayers. It is shown that the ͓Co 73 Si 27 ͑50 Å͒ / Si ͑30 Å͔͒ system exhibits an antiferromagnetic ͑AF͒ coupling at low fields. Moreover, another aspect of SXRMS effect is reported. Using circularly polarized photons, a shift in the AF order Bragg peaks' position is observed and related to two opposite AF states with the spin direction longitudinally aligned. As a consequence, the sensitivity of SXRMS to AF domains having the same spin axis but opposite senses is shown. A physical explanation for the origin of this effect is provided in terms of magnetic-resonant-refraction corrections to Bragg's angle, taking into account the phase shifts between layers with opposite magnetization directions at different in-depth positions. Numerical simulations are performed that reproduced the experimental observations.