1988
DOI: 10.1002/pssa.2211100206
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Interpretation of interference patterns obtained from X-ray Laue interferometers in primary plane waves

Abstract: The situations leading to the emergence of Moire patterns in X-ray interferometers and the dependence of the period of these Moire patterns on the wavelength and the order of reflection are investigated. The definite conditions of the emergence of Moire patterns are elaborated. It is demonstrated, that not all the rotations of the reflecting planes and not all the differences in interplanar spacings in interferometers lead to the formation of Moire patterns. It is shown also, that the period of Moire patterns … Show more

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Cited by 3 publications
(2 citation statements)
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“…It is known [1][2][3][4] that for calculation of scattered wave intensity and diffraction widths of spectral lines it is necessary first to find out the relation of X-ray train length to dimensions of perfection areas of single crystals. The wave train is defined as the vibration of the form described at some length by a simple sinusoidal curve (with constant or slightly varying amplitude), the amplitude of which is zero outside this length.…”
Section: Introductionmentioning
confidence: 99%
“…It is known [1][2][3][4] that for calculation of scattered wave intensity and diffraction widths of spectral lines it is necessary first to find out the relation of X-ray train length to dimensions of perfection areas of single crystals. The wave train is defined as the vibration of the form described at some length by a simple sinusoidal curve (with constant or slightly varying amplitude), the amplitude of which is zero outside this length.…”
Section: Introductionmentioning
confidence: 99%
“…ÓËÔ. 1 Ë (4)): [63].°AEÐÂÍÑ ÏÑÉÇÕ ÄÑÊÐËÍÐÖÕß ÔËÕÖÂÙËâ, ÍÑÅAE ÒÓË ÐÂÎËÚËË ÑAEÐÑÌ ËÎË ÐÇÔÍÑÎßÍËØ ÒÇÓÇÚËÔÎÇÐÐÞØ ÒÓËÚËÐ ÒÑÎÑÔÞ ÏÖÂÓ ÐÂÃÎá-AEÂÕßÔâ ÐÇ ÃÖAEÖÕ [62].¯ÂÒÓËÏÇÓ, AEÑÒÖÔÕËÏ, ÚÕÑ ÓÂÔÜÇÒË- …”
Section: 1´çñóëâ Lll-ëðõçó×çóñïçõóâmentioning
confidence: 99%