A detailed investigation of the conditions for the formation of X-ray shift fringes is carried out, aiming to apply these patterns to investigations of crystal imperfections. Expressions for the amplitudes and X-ray intensity distribution are obtained for a two-crystal interferometer, in which the interplanar distance between two reflecting planes, d, has a relative change Deltad/d approximately 10(-8) - 10(-5). It is theoretically proven and experimentally confirmed that the value of the period of interference bands essentially depends on the sign of Deltad.

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