Use of Dependence of the Edge Effect and X-Ray Focusing for the Interpretation of X-Ray Diffraction Patterns

Drmeyan, H. R.

doi:10.1134/s102745101903025x

Cited by 5 publications

(2 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The answer is clear: the resolution of conventional 3-block interferometers for observing displacement stripes is insufficient. This was proven using our invented diffraction angle magnifier [18][19][20], which was theoretically justified and experimentally implemented in [6,21].…”

Section: Figure 1 (A)mentioning

confidence: 98%

On an X-ray 3-block Laue-interferometer with violation of ideal geometry

Mkhitaryan,

Margaryan,

Vasilyan

et al. 2024

J. Inst.

View full text Add to dashboard Cite

An X-ray monolithic 4-block interference system has been developed and manufactured, in which the first 3 blocks are thin and form a 3- block Laue interferometer with disrupted geometry, and the 4th additional block is thick and is in the reflection position. It is shown that fine structures of interference patterns registered from 3-block interferometers with thin blocks and distorted geometry are observed in cases where an additional 4th thick block is used. The calculations show that when the ideal geometry of a 3-block interferometer is violated, an interference pattern is formed in the form of families of parallel stripes (lines) on the recording plate lying perpendicular to the incident beam. The coordinates of the interference stripes maxima, their periods, as well as the coefficient of a linear enlargement in the presence and absence of the 4th thick block, are calculated. It has been experimentally proven that a thick block does not introduce new information into the interference pattern, but will only enlarge its dimensions in the scattering plane. The limits for reducing the period of interference stripes and their complete disappearance are determined depending on the size of violations from the ideal geometry of a 3-block interferometer.

show abstract

Section: Figure 1 (A)mentioning

confidence: 98%

On an X-ray 3-block Laue-interferometer with violation of ideal geometry

Mkhitaryan,

Margaryan,

Vasilyan

et al. 2024

J. Inst.

View full text Add to dashboard Cite

show abstract

“…X-ray interferometers appeared as a result of the discovery of anomalous passage (the Borman effect) and of following rapid development of the dynamical theory of X-ray interference [7][8][9][10][11][12][13]. Based on the experience of making interferometers of different design and applications [14][15][16][17][18][19], we have designed and made special interferometer and suggested new interferometric method for measurement of X-ray train length (duration of coherent radiation), which was the aim of this work.…”

Section: Introductionmentioning

confidence: 99%

Interferometric Method for Determination of X–ray Train Length

Drmeyan

Mkhitaryan

2022

A. J. P.

View full text Add to dashboard Cite

It is elaborated, made and tested a special interferometer–train metering device. А method for interferometric determination of X–Ray train length is offered. It is proved that the interference pattern disappears, when the path difference between imposing waves is more than the monochromatic X–Ray train length. The limit of disappearance of interference pattern depending on the value of path difference is determined. The X–Ray train length is determined which is close to the meaning determined theoretically.

show abstract