2013
DOI: 10.2200/s00472ed1v01y201301dcs040
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Introduction to Noise-Resilient Computing

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Cited by 4 publications
(4 citation statements)
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References 130 publications
(228 reference statements)
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“…The "stress" or "no-stress" (0 or 1) state can be represented by their probabilities, e.g., the stress in one combatant is detected with a probability 0.7, and 0.8 in the second one. This area is called a "probabilistic logic computing" [73]. − A propagation mechanism.…”
Section: Computational Logicmentioning
confidence: 99%
“…The "stress" or "no-stress" (0 or 1) state can be represented by their probabilities, e.g., the stress in one combatant is detected with a probability 0.7, and 0.8 in the second one. This area is called a "probabilistic logic computing" [73]. − A propagation mechanism.…”
Section: Computational Logicmentioning
confidence: 99%
“…[23], [24]. Even for specialized nanoscale circuits, the International Technology Roadmap for semiconductors predicts that as devices become smaller, thermal noise itself will cause systems to fail catastrophically during normal operation even without supply voltage scaling [7], thus increasing the need for fault-tolerant training.…”
Section: A Related Workmentioning
confidence: 99%
“…It is often speculated [4] that the error-prone nature of brain's hardware helps it be more efficient: rather than paying the cost at a component level, it may be more efficient to accept component-level errors, and utilize sophisticated error-correction mechanisms for overall reliability of the computation 1 . The brain operates at a surprisingly low power of about 15 W [7], and attains high accuracy and speeds, despite individual neurons in the brain being slow and error-prone [4], [5], [8]- [10].…”
Section: Introductionmentioning
confidence: 99%
“…18 Considering that our system always reaches one of the solutions except deadlock, this suggests the capability of spontaneous searching of more than one solution. In the physical electronic circuit, fluctuation is provided from the external electromagnetic noise, low frequency noise in FETs, 19 statistical variation in nanodevices, 20 and so on. In addition, the degree of the parameter variation in our system affected the solution space that the system could search.…”
mentioning
confidence: 99%