Investigation of the Long- and Medium-Term Drift of Zener Diode-Based Voltage Standards

Power, Oliver; Walsh, James E.

doi:10.1109/tim.2004.840227

Cited by 5 publications

(5 citation statements)

References 16 publications

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“…Self-heating in Zener diodes is a matter of concern and should be dealt with accordingly [12] where temperature drift is confirmed. This results in variations in reverse breakdown voltages, and [13] showed that drift is a problem in the medium-and long-term. Long-term stability stress testing revealed that there can be a shift in Zener voltage over time [1].…”

Section: Literature Studymentioning

confidence: 99%

Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

van Niekerk,

Venter

2024

Electronics

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This study investigated the reliability of Zener diodes subjected to a gradually increasing DC switching surge amplitude with delay internals between surges to avoid thermal degradation from different manufacturers with similar specifications. The analysis involved applying occasional 3 ms direct current (DC) switching surges with a gradual increasing surge voltage, followed by a constant current test to verify device functionality for three different selected manufacturer 5.1 V Zener diodes. This experimental approach was used to identify the maximum surge current that each Zener diode could handle before failing to clamp the surge voltage at the specified Zener reference voltage. Statistical analysis revealed significant differences in the maximum average surge current between different manufacturers. The maximum average surge current findings just before failure were 1.98 A, 3.18 A, and 3.33 A, respectively, and associated 95% confidence interval ranges can be used as a reliable metric to compare Zener diode population reliability against occasional DC switching surges. The findings revealed variations in the DC switching surge current handling capabilities between Zener diodes from different manufacturers with similar electrical specifications. The statistically measured maximum average surge current just before device failure can be considered an effective metric to compare the reliability of Zener diodes against DC switching surge degradation.

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Section: Literature Studymentioning

confidence: 99%

Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

van Niekerk,

Venter

2024

Electronics

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“…Ref. [9] proposes mathematical models for the long-and medium-term drift of voltage standards as well as measurements on four different commercial standards, namely, Fluke 732A, Fluke 732B, Datron 4910, and Guildline 4410. Measurement values were taken in an annual comparison over a period of 10 years.…”

Section: Introductionmentioning

confidence: 99%

A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR1000

Bülau,

Walter,

Zimmermann

2024

Metrology

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Voltage standards are widely used to transfer volts from Josephson voltage standards (JVSs) at national metrology institutes (NMIs) into calibration labs to maintain the volts and to transfer them to test equipment at production lines. Therefore, commercial voltage standards based on Zener diodes are used. Analog Devices Inc. (San Jose, CA, USA), namely, Eric Modica, introduced the ADR1000KHZ, a successor to the legendary LTZ1000, at the Metrology Meeting 2021. The first production samples were already available prior to this event. In this article, this new temperature-stabilized Zener diode is compared to several others as per datasheet specifications. Motivated by the superior parameters, a 10 V transfer standard prototype for laboratory use with commercial off-the-shelf components such as resistor networks and chopper amplifiers was built. How much effort it takes to reach the given parameters was investigated. This paper describes how the reference was set up to operate it at its zero-temperature coefficient (z.t.c.) temperature and to lower the requirements for the oven stability. Furthermore, it is shown how the overall temperature coefficient (t.c.) of the circuit was reduced. For the buffered Zener voltage, a t.c. of almost zero, and with amplification to 10 V, a t.c. of <0.01 µV/V/K was achieved in a temperature span of 15 to 31 °C. For the buffered Zener voltage, a noise of ~584 nVp-p and for the 10 V output, ~805 nVp-p were obtained. Finally, 850 days of drift data were taken by comparing the transfer standard prototype to two Fluke 7000 voltage standards according to the method described in NBS Technical Note 430. The drift specification was, however, not met.

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“…Although the new SI base unit definitions are now in effect, the conventional method of establishing a voltage standard using the Josephson voltage device and the quantum Hall effect will continue from a practical point of view after adjusting the numerical values of the von Klitzing constant and Josephson constant from their 1990 values [1,2]. The Zener voltage standards are the most stable transfer standards to disseminate the DC voltage (DCV) standard from the National Metrology Institute (NMI) to NMI or calibration laboratories [3]. In addition, laboratory accreditation bodies require calibration laboratories to justify their calibration and measurement capability (CMC) based on proper calibration intervals of their systems according to standards documents [4,5].…”

Section: Introductionmentioning

confidence: 99%

“…Furthermore, the Korea Laboratory Accreditation Scheme recommends one year as the calibration interval of the devices. This provisional calibration interval could be justified by statistical methods for devices of which the behaviours are predictable [3,10]. However, it is a challenge to establish the initial calibration interval of devices with no calibration record.…”

Section: Introductionmentioning

confidence: 99%

Long-term drift analysis of Zener voltage standards and proposal of an initial calibration interval using calibration records accumulated for 15 years

et al. 2020

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In electrical metrology, voltage is a key quantity together with resistance for realising all electric standards in the low-frequency range. Zener voltage standards are accepted as the most stable to disseminate voltage references traceable to the Josephson standard devices. We study the long-term drift of the Zener devices to propose their initial calibration interval (CI), statistically analysing the calibration records accumulated for 15 years at the Korea Research Institute of Standards and Science (KRISS). First, we apply the direct method where the measurement reliability is obtained by integrating the probability density functions acquired from kernel density estimation (KDE). Markov chain Monte Carlo (MCMC) has been successfully demonstrated to determine the parameters of the Weibull reliability model. A numerical experiment was performed to confirm that the MCMC method works properly and is able to replace the S3 method of NCSLI. The direct method agrees with the MCMC within the highest posterior density (HPD) obtained by the MCMC method. The KDEs of the parameters acquired by the MCMC method enable the uncertainty of the parameters to be expressed in probability distributions rather than in confidence intervals. The final result proposes an initial CI of the 10 V output taps in the Zener devices without any calibration record of 8.8 months with a 0.91-month standard deviation for 90% of the measurement reliability target (MRT) and a 16 µV tolerance limit.

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Investigation of the Long- and Medium-Term Drift of Zener Diode-Based Voltage Standards

Cited by 5 publications

References 16 publications

Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR1000

Long-term drift analysis of Zener voltage standards and proposal of an initial calibration interval using calibration records accumulated for 15 years

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