2013 IEEE 10th International Conference on ASIC 2013
DOI: 10.1109/asicon.2013.6811976
|View full text |Cite
|
Sign up to set email alerts
|

Investigation on effectiveness of series gate resistor in CDM ESD protection designs

Abstract: The impact of gate series resistor on CDM protection effectiveness is systematically evaluated using SPICE simulation and verified with a modified VF-TLP test method. It is shown that the effectiveness of the resistor to a MOS input device is highly dependent on the size of the protected MOS device as well as on the types of ESD protection circuits. Larger MOS devices require smaller resistance values than smaller devices.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2015
2015
2019
2019

Publication Types

Select...
2
2

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
references
References 3 publications
0
0
0
Order By: Relevance