Iodine Migration and Degradation of Perovskite Solar Cells Enhanced by Metallic Electrodes

Beșleagă, Cristina; Abramiuc, Laura Elena; Stancu, V.; Tomulescu, Andrei Gabriel; Sima, M.; Balescu, Liliana Marinela; Plugaru, N.; Pintilie, L.; Nemneş, George Alexandru; Iliescu, Mihaiela; Svavarsson, H. G.; Manolescu, Andrei; Pintilie, I.

doi:10.1021/acs.jpclett.6b02375

Cited by 250 publications

(246 citation statements)

References 55 publications

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“…Presently, a rather large consensus [2] has been reached concerning the origin of the dynamic hysteresis, which points to the ion migration within the perovskite layer as the main reason for the slow process, characterized by a relaxation time τ which is typically in the order of seconds. In particular, iodine migration was already evidenced in several reports, as well as in our own samples [3].…”

Section: Introductionsupporting

confidence: 77%

The Influence of the Relaxation Time on the Dynamic Hysteresis in Perovskite Solar Cells

et al. 2018

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Abstract. We investigate the dynamic behavior of perovskite solar cells by focusing on the relaxation time τ, which corresponds to the slow de-polarization process from an initial bias pre-poled state. The dynamic electrical model (DEM) is employed for simulating the J-V characteristics for different bias scan rates and pre-poling conditions. Depending on the sign of the initial polarization normal or inverted hysteresis may be induced. For fixed pre-poling conditions, the relaxation time, in relation to the bias scan rate, governs the magnitude of the dynamic hysteresis. In the limit of large τ the hysteretic effects are vanishing for the typical range of bias scan rates considered, while for very small τ the hysteresis is significant only when it is comparable with the measurement time interval.

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Section: Introductionsupporting

confidence: 77%

The Influence of the Relaxation Time on the Dynamic Hysteresis in Perovskite Solar Cells

et al. 2018

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“…More details, including the physical properties and time evolution of similar samples, are described in Ref. [26]. First, we calibrate the equivalent circuit elements with a measured J-V characteristics showing NH, performed at a bias scan rate of 20 mV/s, with positive pre-poling bias V pol = 1.2V for t pol =30 s. With this choice, the current overshoot is present in the reverse characteristics and this marked feature enables a more accurate extraction of the model parameters [30,31].…”

Section: Resultsmentioning

confidence: 99%

Normal and Inverted Hysteresis in Perovskite Solar Cells

et al. 2017

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Hysteretic effects are investigated in perovskite solar cells in the standard FTO/TiO2/CH3NH3PbI3−xClx/spiro-OMeTAD/Au configuration.We report normal (NH) and inverted hysteresis (IH) in the J-V characteristics occurring for the same device structure, the behavior strictly depending on the pre-poling bias. NH typically appears at pre-poling biases larger than the open circuit bias, while pronounced IH occurs for negative bias pre-poling. The transition from NH to IH is marked by a intermediate mixed hysteresis behavior characterized by a crossing point in the J-V characteristics. The measured J-V characteristics are explained quantitatively by the dynamic electrical model (DEM). Furthermore, the influence of the bias scan rate on the NH/IH hysteresis is discussed based on the time evolution of the non-linear polarization. Introducing a three step measurement protocol, which includes stabilization, pre-poling and measurement, we put forward the difficulties and possible solutions for a correct PCE evaluation.

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“…Interestingly, the effect is greater in the noncovered regions suggesting that the [60]PCBM layer and/or silver contact slightly protect the device. [33,39,[44][45][46] In both the [60]PCBM and PDI-EH devices, we see the formation of the interfacial AgI layer. The AgI − ion fragment ( Figure S5, Supporting Information) indicates the formation of the interfacial AgI layer, which is fully consistent with the previous findings.…”

Section: Resultsmentioning

confidence: 99%

Effect of Electron‐Transport Material on Light‐Induced Degradation of Inverted Planar Junction Perovskite Solar Cells

Akbulatov

Frolova

Griffin

et al. 2017

Advanced Energy Materials

115

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This paper presents a systematic study of the influence of electron‐transport materials on the operation stability of the inverted perovskite solar cells under both laboratory indoor and the natural outdoor conditions in the Negev desert. It is shown that all devices incorporating a Phenyl C61 Butyric Acid Methyl ester ([60]PCBM) layer undergo rapid degradation under illumination without exposure to oxygen and moisture. Time‐of‐flight secondary ion mass spectrometry depth profiling reveals that volatile products from the decomposition of methylammonium lead iodide (MAPbI3) films diffuse through the [60]PCBM layer, go all the way toward the top metal electrode, and induce its severe corrosion with the formation of an interfacial AgI layer. On the contrary, alternative electron‐transport material based on the perylendiimide derivative provides good isolation for the MAPbI3 films preventing their decomposition and resulting in significantly improved device operation stability. The obtained results strongly suggest that the current approach to design inverted perovskite solar cells should evolve with respect to the replacement of the commonly used fullerene‐based electron‐transport layers with other types of materials (e.g., functionalized perylene diimides). It is believed that these findings pave a way toward substantial improvements in the stability of the perovskite solar cells, which are essential for successful commercialization of this photovoltaic technology.

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Iodine Migration and Degradation of Perovskite Solar Cells Enhanced by Metallic Electrodes

Cited by 250 publications

References 55 publications

The Influence of the Relaxation Time on the Dynamic Hysteresis in Perovskite Solar Cells

The Influence of the Relaxation Time on the Dynamic Hysteresis in Perovskite Solar Cells

Normal and Inverted Hysteresis in Perovskite Solar Cells

Effect of Electron‐Transport Material on Light‐Induced Degradation of Inverted Planar Junction Perovskite Solar Cells

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