2011
DOI: 10.1016/j.jpowsour.2010.06.099
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Ion beam sputter deposition of V2O5 thin films

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Cited by 36 publications
(16 citation statements)
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“…Since a quantitative analysis of the lithium content is not possible by EELS, due to overlap of the lithium adsorption edge at 55 eV with the plasmon region, we analyzed the chemical shift of the titanium edge. This chemical shift is quite sensitive to the oxidation state, as shown in case of vanadium or cobalt [13]. A comparison between the EELS spectrum of a LTO layer and a TiO 2 reference sample (oxidation state þIV) [14] shows that the chemical shifts of both titanium adsorption edges agrees to each other, within an energy loss of z1 eV, indicating an oxidation state of titanium in LTO of þIV, as expected by the stoichiometry of Li 4 Ti 5 O 12 .…”
Section: Structural Investigationsmentioning
confidence: 91%
“…Since a quantitative analysis of the lithium content is not possible by EELS, due to overlap of the lithium adsorption edge at 55 eV with the plasmon region, we analyzed the chemical shift of the titanium edge. This chemical shift is quite sensitive to the oxidation state, as shown in case of vanadium or cobalt [13]. A comparison between the EELS spectrum of a LTO layer and a TiO 2 reference sample (oxidation state þIV) [14] shows that the chemical shifts of both titanium adsorption edges agrees to each other, within an energy loss of z1 eV, indicating an oxidation state of titanium in LTO of þIV, as expected by the stoichiometry of Li 4 Ti 5 O 12 .…”
Section: Structural Investigationsmentioning
confidence: 91%
“…Therefore, peak overlap hinders the direct quantitative evaluation of absorption intensities. However, spectra obtained from commercial VO 2 and V 2 O 5 powders demonstrate that the rising edge of V L shifts to higher energy loss with increasing oxidation state [10,14] while the position of the O K edge is preserved. Therefore, the difference in energy loss between these two edges provides a reliable parameter to quantify the oxidation state and thus oxygen content of deposited layers.…”
Section: Electron Energy Loss Spectroscopymentioning
confidence: 95%
“…In this way, a very sensitive probe is available to determine even minor deviations in composition, oxidation state, or even the character of chemical bounds. We demonstrated this possibility at two important examples, sputter deposited thin films of V 2 O 5 [10] and LiCoO 2 [11]. Interestingly, based on the fine structure of absorption edges, also the Li intercalation state of LiCoO 2 films can be quantified, although the absorption edge of Li cannot be evaluated.…”
Section: Electron Energy Loss Spectroscopymentioning
confidence: 98%
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“…The orthorhombic unit cell structure of V 2 O 5 is the most stable form of the V-O system and consists of double zigzag chain of corner and edge sharing distorted VO 6 octahedra [9]. V 2 O 5 thin films have been prepared onto the different substrates by variety of physical and chemical deposition methods such as DC ion beam sputtering [10], sol-gel technique [11], spray pyrolysis [12], RF magnetron sputtering [13], chemical vapor deposition (CVD) [14], pulsed laser deposition (PLD) [15] and thermal evaporation [16].…”
Section: Introductionmentioning
confidence: 99%