Abstract:Conduction mechanisms in BaTiO 3 films deposited at low temperatures on Cu-electrodes have been investigated in transient and steady regimes as a function of temperatures and electric field. This work aims to identify possible defects which govern the leakage current. Electrical measurements reveal that Space Charge Limited Current (SCLC) constitutes the main leakage mechanism in both the transient and the steady regimes. Based on the theory of SCLC, two types of defects can be detected. At higher temperatures… Show more
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