1965
DOI: 10.1103/physrevlett.15.857
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Isoelectronic Traps Due to Nitrogen in Gallium Phosphide

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Cited by 321 publications
(101 citation statements)
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“…Fig.5 shows PL spectra for a set of GaPxN, samples with x varying 0.004 % to 0.6 % [16]. The spectrum of the most dilute sample shows the emission lines of nearly all the nitrogen induced bound states in GaPN [5]. However, on increasing nitrogen concentration, those sharp lines due to nitrogen pairs at the higher energy side broaden and quench sequentially in the order of increasing binding energy.…”
Section: New "Band Edge" Of Gapnmentioning
confidence: 99%
See 1 more Smart Citation
“…Fig.5 shows PL spectra for a set of GaPxN, samples with x varying 0.004 % to 0.6 % [16]. The spectrum of the most dilute sample shows the emission lines of nearly all the nitrogen induced bound states in GaPN [5]. However, on increasing nitrogen concentration, those sharp lines due to nitrogen pairs at the higher energy side broaden and quench sequentially in the order of increasing binding energy.…”
Section: New "Band Edge" Of Gapnmentioning
confidence: 99%
“…Nitrogen is one of a very distinct group of isoelectronic impurities in I1I-V semiconductors. Long before the finding of the large band gap reduction it was known that the impurity states associated with an isolated nitrogen and various nitrogen pairs have progressively lower energy levels in GaP [5] and GaAs [6,7]. This trend had actually already hinted at the type II band alignment between GaP or GaAs and GaN.…”
Section: Introductionmentioning
confidence: 99%
“…In general, different host/impurity combinations may be divided into two categories: those that create localized gap states, and those that create only resonant states. For example, a DLS located within the gap and below the conduction band minimum (CBM, "α-type behavior") is created for most 3d impurities in III-V semiconductors [1], nitrogen [2,3,4] and oxygen [3,5] in GaP, oxygen in ZnTe [6,7], hydrogen in MgO [8], or oxygen vacancies in Al 2 O 3 [9]. On the other hand, the DLS is located above the CBM ("β-type behavior") for nitrogen in GaAs [3,4,10], oxygen in ZnS or ZnSe [11], hydrogen in ZnO [12], oxygen vacancies in In 2 O 3 [9], as well as all classic, hydrogenic donors in semiconductors [13].…”
Section: Introductionmentioning
confidence: 99%
“…It is known that the isoelectronic traps can improve the efficiency of radiative recombination of electrons and holes, as was shown for the light--emitting diodes based on GaP:N [4]. In the paper [5], the authors report the observation of an exciton bound with isoelectronic nitrogen atom in GaP. According to Hopfield et al, the difference of electronegativity between nitrogen and phosphor was suggested to be responsible for the binding of the exciton to the nitrogen center [6].…”
Section: Introductionmentioning
confidence: 95%