Kelvin Probe Force Microscopy with Atomic Resolution

Li, Yan Jun; Wen, Haunfei; Min, Zong; Kou, Lili; Naitoh, Yoshitaka; Sugawara, Yasuhiro

doi:10.1007/978-3-319-75687-5_14

Cited by 9 publications

(14 citation statements)

References 49 publications

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“…The observed difference in the CPD measured by these two CL KPFM modes is well documented [36,50,51,58] and is related to the physical quantity on which each mode operates. On one hand, the feedback loop of the CL AM-KPFM tries to nullify the magnitude of the electrostatic force developed between the AFM probe and sample.…”

Section: Resultsmentioning

confidence: 73%

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Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

Stan¹,

Namboodiri²

2021

Beilstein J. Nanotechnol.

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The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be analyzed a posteriori, modeled, and interpreted to include various contributions from the probe geometry and imaged features of the sample. In contrast to this, the currently implemented closed-loop (CL) variants of KPFM, either amplitude-modulation (AM) or frequency-modulation (FM), solely report on their final product in terms of the tip–sample contact potential difference. In ambient atmosphere, both CL AM-KPFM and CL FM-KPFM work at their best during the lift part of a two-pass scanning mode to avoid the direct contact with the surface of the sample. In this work, a new OL AM-KPFM mode was implemented in the single-pass scan of the PeakForce Tapping (PFT) mode. The topographical and electrical components were combined in a single pass by applying the electrical modulation only in between the PFT tip–sample contacts, when the AFM probe separates from the sample. In this way, any contact and tunneling discharges are avoided and, yet, the location of the measured electrical tip–sample interaction is directly affixed to the topography rendered by the mechanical PFT modulation at each tap. Furthermore, because the detailed response of the cantilever to the bias stimulation was recorded, it was possible to analyze and separate an average contribution of the cantilever to the determined local contact potential difference between the AFM probe and the imaged sample. The removal of this unwanted contribution greatly improved the accuracy of the AM-KPFM measurements to the level of the FM-KPFM counterpart.

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Section: Resultsmentioning

confidence: 73%

“…This simple and practical deconvolution increased the spatial resolution of the OL AM-KPFM at the level of an FM-KPFM method. The OL KPFM variant proposed here adds to a growing set of PFT- based platform techniques that includes electrical [57,58], chemical [59], optical [60,61], and mechanical [62,63] measurements.…”

Section: Introductionmentioning

confidence: 99%

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

Stan¹,

Namboodiri²

2021

Beilstein J. Nanotechnol.

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“…The main advantages of PF-KPFM are related to the AFM probe which is specially designed with high quality factor Q, low spring constant k and without coating (very smal tip radius). As a consequence the surface potential profile can be probed by PF-KPFM with high spatial resolution and with close to the theoretical V CPD values [37]. However, until now this mode is dedicated to surface potential mapping and does not appear suitable to investigate charge distribution in dielectric films.…”

Section: Surface Potential Measurement In Pf-kpfmmentioning

confidence: 99%

“…Peak Force-KPFM (PF-KPFM) is a quite new mode introduced in 2010 by Bruker © . It combines the advantages of Peak Force Quantitative NanoMechanical (PF-QNM) mode and the high spatial resolution of FM-KPFM [37]. The PF-KPFM is performed in lift mode in two measurements steps: (i) Topography is measured in PF-QNM which allows improvement of the lateral resolution, decrease of the interaction force while probing simultaneously surface mechanical properties [38].…”

Section: Surface Potential Measurement In Pf-kpfmmentioning

confidence: 99%

Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM

Villeneuve-Faure

Boudou

Teyssèdre

2019

NanoScience and Technology

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“…In the case of conventional EFM method, two LIAs are used in a series to extract the side-band signals. The first lock-in amplifier (LIA) can produce a phase output, and the amplitude of the side-band frequency can be measured by feeding the phase output to the second LIA [32]. However, in current study, the force-gradient signals can be directly detected by feeding the side-band frequency to the external LIA of the EFM as a reference signal.…”

Section: Introductionmentioning

confidence: 96%

Creation of Optimal Frequency for Electrostatic Force Microscopy Using Direct Digital Synthesizer

et al. 2017

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Electrostatic force microscopy (EFM) is a useful technique when measuring the surface electric potential of a substrate regardless of its topography. Here, we have developed a frequency detection method for alternating current (AC) bias in EFM. Instead of an internal lock-in amplifier (LIA) for EFM that only detects ω e and 2ω e , we have used other LIAs that can amplify the amplitude of specific frequency by direct digital synthesizer (DDS), that finds the optimal frequency of surface charge images. In order to confirm the performance of the proposed methods, the electrical properties of lead zirconate titanate (PZT) and triglycine sulfate (TGS) samples were measured. In addition, we compared the performances of the frequency-detection method and the conventional EFM method. Ultimately, enhanced images could be achieved using the frequency-detection method. The optimal modulated frequency-shift for force-gradient measurements was found to be 2 kHz. Additionally, we have shown that it is possible to use a hard cantilever (K = 42 N/m, 330 kHz). Therefore, we expect that this technique can be applied to measure the electrical properties of bio-molecular films.

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Kelvin Probe Force Microscopy with Atomic Resolution

Cited by 9 publications

References 49 publications

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM

Creation of Optimal Frequency for Electrostatic Force Microscopy Using Direct Digital Synthesizer

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