Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns

Abstract

In order to retrieve crystallographic information from an electron backscatter Kikuchi diffraction pattern, its Kikuchi bands have to be localized. One of the main reasons for the limited precision of the present Kikuchi band localization methods is that the diffuse edges of a Kikuchi band are convoluted by many other Kikuchi bands that intersect them. To improve the localization accuracy, Kikuchi bands have to be deconvoluted. In this article, a new method for the deconvolution and localization of Kikuchi bands is presented. The deconvolution is based on the fact that, in a Kikuchi pattern, there are a number of Kikuchi bands that are not parallel to the bands that intersect them. It is performed in Fourier space. After deconvolution, localization is carried out by a quantitative shape analysis of the intensity profiles of the deconvoluted Kikuchi bands. Using the introduced method, for a real electron backscatter Kikuchi diffraction pattern with 45 half capture angle and 0.12 per pixel maximum scale factor, the characteristic hyperbolic features of the Kikuchi bands can be localized with a precision of better than 0.1 in reflection angle.

Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography

“…Note that also the obviously perfect twin marked ① in Figure (c) results in a deviation of 1.1° ± 0.3°. The aforementioned reported values are thus at the edge of accuracy of the used EBSD measurements and can only be used to report a trend but do not indicate absolute values .…”

Validation of kinematically simulated pattern HR-EBSD for measuring absolute strains and lattice tetragonality

“…treating these as though they were straight lines, in the peak-finding algorithm that is applied in Hough space to find the centers of the bands, introduces error into the final orientation determination [3][4][5].…”

Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique

“…The point where all the lattice planes meet (O C ) can be approximated by the projection center of the pattern (s). For an exhaustive model for the geometry of diffraction the work of Randle & Engler (2000), Krieger Lassen (1994), Schwarzer (1997) and Ram et al (2014) can be consulted. Once s is localized, the required information for the three-dimensional reconstruction of all the lattice planes, and hence the entire crystal, is provided.…”

“…The first source of orientation error is the plane trace detection (localization) error. There are several methods for plane trace localization (Juul Jensen & Schmidt, 1991;Wright & Adams, 1992;Krieger Lassen, 1994, 1996aMaurice & Fortunier, 2008;Basinger et al, 2011;Ram et al, 2014). Among them, the classical two-dimensional Hough-transform-based method (Krieger Lassen, 1994), which is most widely used in standard EBSD software, is discussed here.…”