Large format CID x-ray image sensors

Carbone, Joseph; Alam, Zulfiquar; Borman, Claudia; Czebiniak, Steven; Ziegler, H.

doi:10.1117/12.304550

Cited by 6 publications

(4 citation statements)

References 3 publications

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“…The initial interest was to measure the emission from highly ionized Ge so the camera was characterized in the 10 keV region using the HEX source (Carbone, 1998 andMarshall, 2001). The fluorescers chosen were Cu, Ge, and Rb giving weighted average for the K-L and K-M transitions of 8.13 keV, 10.01 keV, and 13.58 keV respectively.…”

Section: Single Photon Measurements Using the Manson Sourcementioning

confidence: 99%

Quantitative Measurements of X-Ray Intensity

Haugh¹,

Schneider²

2011

Photodiodes - Communications, Bio-Sensings, Measurements and High-Energy Physics

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Section: Single Photon Measurements Using the Manson Sourcementioning

confidence: 99%

Quantitative Measurements of X-Ray Intensity

Haugh¹,

Schneider²

2011

Photodiodes - Communications, Bio-Sensings, Measurements and High-Energy Physics

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“…[1][2][3] These CID cameras are fabricated using a high-resistivity P-channel process and have a rated lifetime dosage of at least 300 krad(Si) at 60 -90 keV. That is ~ 20× higher than typical N-channel CCD cameras which cease to function after 10 -20 krad(Si).…”

Section: Cid Radiation Hardnessmentioning

confidence: 99%

“…1,9 The sensor was selected based on a history of successful use on ICF experiments at the Univ. of Rochester's OMEGA Laser Facility.…”

Section: Cid Imaging Sensor Characteristicsmentioning

confidence: 99%

Performance of CID camera x-ray imagers at NIF in a harsh neutron environment

et al. 2013

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Charge-injection devices (CIDs) are solid-state 2D imaging sensors similar to CCDs, but their distinct architecture makes CIDs more resistant to ionizing radiation.1-3 CID cameras have been used extensively for X-ray imaging at the OMEGA Laser Facility 4,5 with neutron fluences at the sensor approaching 10 9 n/cm 2 (DT, 14 MeV). A CID Camera Xray Imager (CCXI) system has been designed and implemented at NIF that can be used as a rad-hard electronic-readout alternative for time-integrated X-ray imaging. This paper describes the design and implementation of the system, calibration of the sensor for X-rays in the 3 -14 keV energy range, and preliminary data acquired on NIF shots over a range of neutron yields. The upper limit of neutron fluence at which CCXI can acquire useable images is ~ 10 8 n/cm 2 and there are noise problems that need further improvement, but the sensor has proven to be very robust in surviving high yield shots (~ 10 14 DT neutrons) with minimal damage.

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“…The camera is the detector in a spectrometer system that is used on the LLNL NIF target chamber. The initial interest was to measure the emission from highly ionized Ge so the camera was characterized in the 10 keV region using the HEX source (Carbone, 1998;Marshall, 2001). The fluorescers chosen were Cu, Ge, and Rb giving weighted average for the K-L and K-M transitions of 8.13 keV, 10.01 keV, and 13.58 keV respectively.…”

Section: Characterizing and Calibrating An Uncooled X-ray Cid (Chargementioning

confidence: 99%

Calibration of X-ray imaging devices for accurate intensity measurement

et al. 2012

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National Security Technologies (NSTec) has developed calibration procedures for X-ray imaging systems. The X-ray sources that are used for calibration are both diode type and diode/fluorescer combinations. Calibrating the X-ray detectors is key to accurate calibration of the X-ray sources. Both energy dispersive detectors and photodiodes measuring total flux were used. We have developed calibration techniques for the detectors using radioactive sources that are traceable to the National Institute of Standards and Technology (NIST). The German synchrotron at Physikalische Technische Bundestalt (PTB) is used to calibrate silicon photodiodes over the energy range from 50 eV to 60 keV.The measurements on X-ray cameras made using the NSTec X-ray sources have included quantum efficiency averaged over all pixels, camera counts per photon per pixel, and response variation across the sensor. The instrumentation required to accomplish the calibrations is described. X-ray energies ranged from 720 eV to 22.7 keV. The X-ray sources produce narrow energy bands, allowing us to determine the properties as a function of X-ray energy. The calibrations were done for several types of imaging devices. There were back illuminated and front illuminated CCD (charge coupled device) sensors, and a CID (charge injection device) type camera. The CCD and CID camera types differ significantly in some of their properties that affect the accuracy of X-ray intensity measurements. All cameras discussed here are silicon based. The measurements of quantum efficiency variation with X-ray energy are compared to models for the sensor structure. Cameras that are not back-thinned are compared to those that are.

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Large format CID x-ray image sensors

Cited by 6 publications

References 3 publications

Quantitative Measurements of X-Ray Intensity

Quantitative Measurements of X-Ray Intensity

Performance of CID camera x-ray imagers at NIF in a harsh neutron environment

Calibration of X-ray imaging devices for accurate intensity measurement

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