2005
DOI: 10.1080/00150190590967026
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Laser Interferometric Displacement Measurements of Multi-Layer Actuators and PZT Ceramics

Abstract: This paper deals with the characterization of multi-layer actuators and bulk PZT ceram-

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Cited by 10 publications
(7 citation statements)
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“…The effective longitudinal piezoelectric coefficient (d 33,f 6 standard deviation) was determined through standard double beam laser interferometry (aixACCT Systems, aixDBLI) measurements [35,36]. DBLI polarization and displacement curves were compared for Samples 1-2 in the as-deposited state and Sample 3 after annealing.…”
Section: Methodsmentioning
confidence: 99%
“…The effective longitudinal piezoelectric coefficient (d 33,f 6 standard deviation) was determined through standard double beam laser interferometry (aixACCT Systems, aixDBLI) measurements [35,36]. DBLI polarization and displacement curves were compared for Samples 1-2 in the as-deposited state and Sample 3 after annealing.…”
Section: Methodsmentioning
confidence: 99%
“…The assembly of these substantially different materials in a piezoelectric-silicone structure requires the experiment to be reproducible and simple in order to derive the energy harvesting capabilities of the device tested. For this reason, the proposed materials were tested at room temperature accounting for the Curie point of PZT below 300 • C [26] and the transition temperature for silicone of over 400 • C [38]. This leaves sufficient space for energy harvesting applications at elevated temperatures, which could be evaluated in subsequent studies.…”
Section: Dynamic Testingmentioning
confidence: 99%
“…The paper [24] studies multi-layer actuators and bulk lead zirconate titanate ceramics under the influence of electric fields. It is well-known that laser interferometry is a general and broadly used method for measuring induced displacements [25,26].…”
Section: Introduction and Purpose Of The Studymentioning
confidence: 99%
“…For example, the "point-to-point" scanning method, or the "out-of-plane displacements", measured using a Moiré interferometer [27], have proven their value in these applications. The displacement of materials and devices with evaporated reflective dielectric layers has been studied using a double-beam Mach-Zehnder laser interferometer at room temperature [24].…”
Section: Introduction and Purpose Of The Studymentioning
confidence: 99%