Leakage currents in porous PZT films

Podgorny, Yu. V.; Воротилов, К. А.; Lavrov, P. P.; Сигов, А. С.

doi:10.1080/00150193.2016.1217140

Cited by 11 publications

(8 citation statements)

References 21 publications

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“…However, in this case, the hysteresis loops do not show the pronounced saturation region commonly observed in the hysteresis loops of films with enhanced leakage currents 53–55 . Indeed, increased leakage currents in porous PZT films prepared using a PVP‐based sol–gel technique have been reported elsewhere 56 . These increased leakage currents might be attributable to an enhanced concentration of oxygen vacancies resulting from PbO loss 57 or carbon residuals at the pore interfaces 58 .…”

Section: Resultsmentioning

confidence: 71%

Microstructure analysis of porous lead zirconate–titanate films

et al. 2021

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Porous ferroelectric lead zirconate–titanate (PZT) films with different internal structures are synthesized using a sol–gel technique and spin‐on deposition on platinized silicon substrates. The films’ porosity is engineered using various structure‐directing agents: polyvinylpyrrolidone with a molecular weight of 360 000 (1–6.6 wt.%) and block copolymer surfactants Brij 30 and Brij 76 (30–60 wt.%). The films’ structures are characterized by transmission electron microscopy. The PVP‐based films contain large, elongated pores with diameters as large as 100 nm. By contrast, the films prepared from solutions with block copolymers exhibit a small pore size depending on the surfactant molecular weight (10–19 nm for Brij 30 and 20–27 nm for Brij 76), with a mostly uniform distribution of channel‐like pores within the film volume. Despite their highly porous structures, all of the films show a columnar‐grain perovskite structure with grains as large as several micrometers and curved grain boundaries. The films demonstrate ferroelectric behavior with dielectric hysteresis, and their permittivity decreases with increasing porosity. Thus, the Brij 30 and Brij 76 copolymer surfactants can be used to engineer fine porous structures in PZT films for various applications in electronics.

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Section: Resultsmentioning

confidence: 71%

Microstructure analysis of porous lead zirconate–titanate films

et al. 2021

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“…(6) is 2.6 lS/cm. Note that this value is higher by about two orders than the static conductivity values for porous PZT films 16 due to the effect of low-frequency relaxation losses. 18 It should be noted that the dead layer discussed here and the Schottky depletion layer are not the same thing, as is sometimes supposed.…”

mentioning

confidence: 73%

“…Porous films were obtained by a polyvinylpyrrolidone (PVP) assisted process; for details, see Ref. 16. Silicon wafers with the Pt (150 nm)/TiO 2 (10 nm)/SiO 2 (300 nm)/Si structure (produced by Inostec, Korea) were used as substrates.…”

mentioning

confidence: 99%

“…The reason is high leakage currents in porous films changing the potential distribution across the layered structure. 16 Figure 3 shows an equivalent circuit of the ferroelectric film with the dead layer, taking into account conductivity r of the ferroelectric film. A shunting effect of the conductivity r on the voltage distribution in the layered structure varies inversely with the square of the measurement frequency x This equation shows that the shunting effect becomes more pronounced when the difference between the values of the permittivity of the ferroelectric volume and the dead layer increases, and the measurement frequency decreases.…”

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confidence: 99%

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Dead layer thickness estimation at the ferroelectric film-metal interface in PZT

Podgorny

Воротилов

Сигов

et al. 2019

Applied Physics Letters

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Different models for estimation of the dead layer thickness at the ferroelectric film-metal interface are discussed, including the small-signal capacitance model and two methods based on dielectric hysteresis analysis-one based on slopes of the hysteresis loops at the coercive field and the other method based on comparison of dielectric hysteresis portraits. It is shown that the latter technique yields more reliable data as it excludes the effect of leakage and relaxation loss. Conductivity may have a pronounced effect on the validity of dead-layer thickness data. This work relates peripherally to negative capacitance in ferroelectric films and to lozenge-shaped hysteresis curves.

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“…A similar trend was exhibited for both acetate and formate chitosan films, whereby the thickness was increased as the volume of chitosan was increased. Thin-film thickness is a key parameter that could enhance the crystallinity and enhance the film's piezoelectric characteristics [21].…”

Section: Physical and Structural Properties Of Acetate And Formate Ch...mentioning

confidence: 99%

Fabrication of Biopolymer-Based Piezoelectric Thin Film From Chitosan Using Solvent Casting Method

Mohammed

Harttar

Ahmad

2022

ARASET

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The application of biopolymer in piezoelectric application provides a great potential to replace traditional piezoelectric substances like polyvinylidene fluoride (PVDF) and lead zirconate titanium (PZT), because of their biodegradability, biocompatibility, low toxicity properties and sustainable production. Chitosan, a natural polysaccharide has been found to fulfil all the characteristics and can be used safely for piezoelectric applications in agricultural, food industries and biomedical fields. This study aims to assess how piezoelectric characteristics are affected by different acid solvents and solvent casting volumes during chitosan thin film production. Chitosan thin film prepared using acetic acid and formic acid were fabricated using solvent casting method on petri dish at different volume of acids solvent. Chitosan thin films produced using acetic acid and 25 mL solvent loading provided the most significant mechanical quality factor (2.8). Moreover, the dissipation factor (0.80) was the lowest, indicating comparability to traditional thin PVDF film piezopolymer. Hence, thin chitosan films produced using acetic acid is proven to have the potential in piezoelectric application

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Leakage currents in porous PZT films

Cited by 11 publications

References 21 publications

Microstructure analysis of porous lead zirconate–titanate films

Microstructure analysis of porous lead zirconate–titanate films

Dead layer thickness estimation at the ferroelectric film-metal interface in PZT

Fabrication of Biopolymer-Based Piezoelectric Thin Film From Chitosan Using Solvent Casting Method

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