2010
DOI: 10.1143/jjap.49.04dj04
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Light-Induced Carrier Transfer in NiSi-Nanodots/Si-Quantum-Dots Hybrid Floating Gate in Metal–Oxide–Semiconductor Structures

Abstract: A new mechanism of superfast motion of resistive domains in anisotropic superconductors is suggested. For bicrystals or sandwiches of anisotropic superconducting materials, the superfast motion is shown to arise due to the additional Joule heating of the kink regions of a resistive domain by eddy currents associated with them. Conditions under which the resistive domain in an anisotropic superconductor moves with a velocity up to the Fermi velocity, ∼10 8 cm s −1 , are discussed. As a result of the superfast m… Show more

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Cited by 6 publications
(7 citation statements)
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“…Under positive V g , electrons were stored within the Si nanocrystals, while holes tunneled to the density of states of the device substrate, enabling a fast programming speed (i.e., 10 –8 to 10 –6 s) which is approximately 10 3 times faster than that of the electrically programmed devices. An experimental demonstration of a Si QD-based optical flash device has been reported by Morisawa et al The floating gate comprised a light-sensitive NiSi nanodot film sandwiched between two Si QD layers. To reveal the impact of optical treatment on the charge carrier transfer, the capacitance–voltage ( C – V ) characteristics were performed.…”
Section: Qds In Flash Memorymentioning
confidence: 99%
“…Under positive V g , electrons were stored within the Si nanocrystals, while holes tunneled to the density of states of the device substrate, enabling a fast programming speed (i.e., 10 –8 to 10 –6 s) which is approximately 10 3 times faster than that of the electrically programmed devices. An experimental demonstration of a Si QD-based optical flash device has been reported by Morisawa et al The floating gate comprised a light-sensitive NiSi nanodot film sandwiched between two Si QD layers. To reveal the impact of optical treatment on the charge carrier transfer, the capacitance–voltage ( C – V ) characteristics were performed.…”
Section: Qds In Flash Memorymentioning
confidence: 99%
“…2, which was determined by high-resolution x-ray photoemission measurements [12]. [ 16,17]. In fact, C-V characteristics of MOS capacitors with a triply-stacked hybrid NDs FG seen in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The slow response speed is mainly due to small tunneling rate through interlayer oxide [17] and partly due to misalignment in NDs stack. In fact, with a decrease in the internal oxide down to ~1.4nm, a response speed of the order of ten milliseconds was obtained even at zero gate bias [18].…”
Section: Electrical Characterization Of Hybrid Fgmentioning
confidence: 99%