Locking phenomenon of polarization flipping in He–Ne laser with a phase anisotropy feedback cavity

Chen, Wenxue; Zhang, Shulian; Long, Xingwu

doi:10.1364/ao.51.000888

Cited by 8 publications

(3 citation statements)

References 29 publications

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“…Recently, a laser feedback polarization-flipping (LFPF) method [18] has been reported, and it is proved to be feasible for the online measurement [19]. However, a locking phenomenon of polarization flipping is found when the phase retardation is small [20]; furthermore, high stability and a low noise level of the working environment is strictly required because of the sensitivity of the laser feedback to vibrations.…”

Section: Introductionmentioning

confidence: 99%

Measurement method for optical retardation based on the phase difference effect of laser feedback fringes

et al. 2015

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We present a measurement method for optical phase retardation, which utilizes a phase-difference phenomenon of the feedback fringes in orthogonally polarized directions of a laser with anisotropic weak feedback. This phase difference is dominated by the measured retardation. The measurement principles are given based on the 3-mirror cavity model, and experiments are conducted with quartz waveplates (WPs). A measurement range 0°-180° is achieved, the uncertainty is theoretically better than 0.5°, and the measurement precision can be improved further. This method does not require researchers to know beforehand the principal axes directions of the WPs, and has better anti-disturbance ability than the previous method based on laser feedback.

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Section: Introductionmentioning

confidence: 99%

Measurement method for optical retardation based on the phase difference effect of laser feedback fringes

et al. 2015

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“…13 More particularly, an accuracy of 0.2 • was achieved in phase retardation measurements representing a marked improvement on previous measurements. 13 Below we introduce the principle and setup of the laser feedback technique and describe how measurement error in ellipsometry is eliminated using the laser-feedback assembly.The typical configuration of ellipsometry consists of a light source, polarizer, compensator, analyzer, and detector in a) Electronic mail: zsl-dpi@mail.tsinghua.edu.cn. a setup sketched in Fig.…”

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confidence: 99%

Note: Error elimination for ellipsometry by laser feedback instrument

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Zhang

Long

et al. 2014

Review of Scientific Instruments

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Ellipsometry has in recent decades been used in measuring optical phase retardation. Known for its high resolution but uncertain accuracy, we analyze the systematic error involved with this technique and give error values regarding phase retardation measurements. We developed a laser-feedback assembly to measure phase retardation to a higher resolution and accuracy compared with that from ellipsometry. We eliminated the systematic error associated with ellipsometry using results obtained with this assembly and improved measurement accuracies for ellipsometry to about 0.2°. Such high-precision ellipsometry would greatly improve the manufacturing of wave plates.

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