2013
DOI: 10.1109/lpt.2013.2280719
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Low-Frequency Noise Characteristics of In-Doped ZnO Ultraviolet Photodetectors

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Cited by 31 publications
(9 citation statements)
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“…The properties of doped ZnO 1D‐NSs have been widely investigated both experimentally and theoretically. In this section, we will review recent articles about doped ZnO 1D‐NS photodetectors, and provid an overview of the optical properties and measured results which are briefly summarized in Table 3 . The performance of doped ZnO 1D‐NS photodetectors is greatly superior to ZnO or doped ZnO thin film photodetectors, but it still cannot compare to conventional top‐down fabricated GaN‐based photodetectors due to a very slow photoresponse time.…”
Section: Photodetection Properties Of Doped Zno 1d‐nssmentioning
confidence: 99%
“…The properties of doped ZnO 1D‐NSs have been widely investigated both experimentally and theoretically. In this section, we will review recent articles about doped ZnO 1D‐NS photodetectors, and provid an overview of the optical properties and measured results which are briefly summarized in Table 3 . The performance of doped ZnO 1D‐NS photodetectors is greatly superior to ZnO or doped ZnO thin film photodetectors, but it still cannot compare to conventional top‐down fabricated GaN‐based photodetectors due to a very slow photoresponse time.…”
Section: Photodetection Properties Of Doped Zno 1d‐nssmentioning
confidence: 99%
“…Such observation also indicates that In is incorporated into NRs. 50 Fig . 22a shows the transient response of the fabricated photosensor.…”
Section: Performance Of Uv Photosensors With Al- Ga- and In-doped Zmentioning
confidence: 99%
“…Figure S4 in the Supporting Information, shows the noise power spectrum of the device. It is seen that low‐frequency noise (1/ f ), mainly originated from the mobility fluctuation caused by scattering of acoustic phonons and ionized impurities, dominates the device total noise. NEP is thus determined to be 3.7 × 10 −11 W by integrating the noise power density spectrum, giving rise to a D * of ≈5.25 × 10 12 Jones.…”
mentioning
confidence: 99%
“…The difference between our result and the maximum value comes from the device structures. It is known that NEP value is largely determined by the dark current, and photodiode‐type devices produce much lower dark current than photoconductor‐type devices, thus resulting in a smaller NEP and a higher D * . We expect that the D * of the CH 3 NH 3 PbI 3 MW array‐based photodetectors may be readily improved by further optimizing the device structure, such as introducing an asymmetrical electrodes to form a Schottky‐contact photodetector …”
mentioning
confidence: 99%