Low‐temperature EDX microanalysis of halogenated copper phthalocyanine samples

Abstract

SUMMARY X‐ray microanalysis at temperatures near that of liquid nitrogen is used to determine the halogen content of small volumes of halogenated copper phthalocyanine pigments. Details of the low‐temperature stage used and the benefits conferred by cooling the sample are given. The experimental procedure adopted involved recording a series of spectra from the same area and extrapolating the measured compositions to zero dose. Factors affecting the accuracy of the analyses are discussed.