In this work, ferroelectricity is
identified in nanocrystalline
BiFeO3 (BFO) thin films prepared by low-temperature atomic
layer deposition. A combination of X-ray diffraction, reflection high
energy electron
diffraction, and scanning transmission electron microscopy analysis
indicates that the as-deposited films (250 °C) consist of BFO
nanocrystals embedded in an amorphous matrix. Postannealing at 650
°C for 60 min converts the sample to a crystalline film on a
SrTiO3 substrate. Piezoelectric force microscopy demonstrates
the existence of ferroelectricity in both as-deposited and postannealed
films. The ferroelectric behavior in the as-deposited stage is attributed
to the presence of nanocrystals. Finally, a band gap of 2.7 eV was
measured by spectroscopic ellipsometry. This study opens broad possibilities
toward ferroelectric oxides on 3D substrates and also for the development
of new ferroelectric perovskites prepared at low temperature.