This study systematically investigates the effects of pentacene deposition rates and channel lengths on the electrical characteristics of pentacene-based organic thin-film transistors (OTFTs), and the performance degradation of OTFTs under the positive drain bias stress. With a slower deposition rate of the pentacene channel layer, the larger grain size is formed, and it improves the performance of pentacene-based OTFTs. As the channel length decreases, the threshold voltage (V TH ) shifts toward the positive direction and the field-effect mobility (μ FE ) decreases, which are due to the drain-induced barrier lowering effect and the lower mobility in the active channel near the region of source/drain electrodes, respectively. In addition, we also propose a mechanism to present the channel length dependence on the field-effect mobility. Results also show that the pentacene-based OTFTs, which are under positive drain bias stress, exhibit greater performance degradation than those under negative drain bias stress. The greater performance degradation, the decreasing I ON and the larger V TH shift are due to the greater trap state density (N trap ) created in the bulk channel by the large lateral electrical field and the carriers injected into the gate insulator by the large vertical electrical field, respectively.