Pulsed versus continuous wave plasma polymerization of
perfluorocyclohexane is compared
as a function of duty cycle off-time, on-time, and peak power. The
chemical composition of the deposited
films has been determined by X-ray photoelectron spectroscopy (XPS).
A greater retention of the chemical
structure associated with the precursor molecule is found for the
pulsed plasma polymerization
experiments. This can be rationalized in terms of the relative
perturbation of reactive species contained
in the electrical discharge.