Low voltage TEM: Influences on electron energy loss spectrometry experiments

Stöger-Pollach, Michael

doi:10.1016/j.micron.2010.04.007

Cited by 20 publications

(9 citation statements)

References 29 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Moreover, low‐energy electrons can also increase the efficiency in valence features in electron energy loss spectroscopy (EELS; VEELS) due to an enhanced signal‐to‐noise ratio. The relativistic energy loss (Cerenkov loss) is suppressed at low‐energy accelerating voltages . In particular, systems implementing a thermionic emission gun can a have much higher energy resolution in EELS when operating with lower electron energies …”

Section: Aberration‐corrected Tem and Its Relevance To Sp2 Carbonmentioning

confidence: 99%

See 1 more Smart Citation

Low Voltage Transmission Electron Microscopy of Graphene

Bachmatiuk

Zhao

Gorantla

et al. 2014

Small

View full text Add to dashboard Cite

The initial isolation of graphene in 2004 spawned massive interest in this two-dimensional pure sp(2) carbon structure due to its incredible electrical, optical, mechanical, and thermal effects. This in turn led to the rapid development of various characterization tools for graphene. Examples include Raman spectroscopy and scanning tunneling microscopy. However, the one tool with the greatest prowess for characterizing and studying graphene is the transmission electron microscope. State-of-the-art (scanning) transmission electron microscopes enable one to image graphene with atomic resolution, and also to conduct various other characterizations simultaneously. The advent of aberration correctors was timely in that it allowed transmission electron microscopes to operate with reduced acceleration voltages, so that damage to graphene is avoided while still providing atomic resolution. In this comprehensive review, a brief introduction is provided to the technical aspects of transmission electron microscopes relevant to graphene. The reader is then introduced to different specimen preparation techniques for graphene. The different characterization approaches in both transmission electron microscopy and scanning transmission electron microscopy are then discussed, along with the different aspects of electron diffraction and electron energy loss spectroscopy. The use of graphene for other electron microscopy approaches such as in-situ investigations is also presented.

show abstract

Section: Aberration‐corrected Tem and Its Relevance To Sp2 Carbonmentioning

confidence: 99%

“…The relativistic energy loss (Cerenkov loss) is suppressed at low‐energy accelerating voltages . In particular, systems implementing a thermionic emission gun can a have much higher energy resolution in EELS when operating with lower electron energies …”

Section: Aberration‐corrected Tem and Its Relevance To Sp2 Carbonmentioning

confidence: 99%

Low Voltage Transmission Electron Microscopy of Graphene

Bachmatiuk

Zhao

Gorantla

et al. 2014

Small

View full text Add to dashboard Cite

show abstract

“…As a further consequence, the zero loss peak (ZLP) tails are narrowed leading to an improvement of the analysis of the band structure as well as the dielectric properties. This is a very positive effect for semiconductor and insulator analysis [9].…”

Section: Introductionmentioning

confidence: 97%

Consequences of the CMR effect on EELS in TEM

2017

View full text Add to dashboard Cite

Double perovskite oxides have gained in importance and exhibit negative magnetoresistance, which is known as colossal magnetoresistance (CMR) effect. Using a LaCoMnO (LCM) thin film layer, we proved that the physical consequences of the CMR effect do also influence the electron energy loss spectrometry (EELS) signal. We observed a change of the band gap at low energy losses and were able to study the magnetisation with chemical sensitivity by employing energy loss magnetic chiral dichroism (EMCD) below the Curie temperature T, where the CMR effect becomes significant.

show abstract

“…Therefore a technique was developed to excavate them mathematically [2]. An experimental possibility is to reduce the beam energy [3,4,5] such that the speed of the swift probe electron v does not exceed the speed of light inside the sample c/n (with c as the vacuum speed of light and n as the refractive index of the probed material). In the case of indirect band gaps off axis measurements -also known as dark field EELS -are useful.…”

Section: Introductionmentioning

confidence: 99%

“…The shift of the signal onset is reduced when reducing the electron beam energy and there is no shift below theČerenkov limit. This means that only below this limit the direct band gap of the investigated material can be observed and Kramers-Kronig Analysis (KKA) can be applied in order to determine the optical properties [3,4,7]. When KKA is applied on a Si low loss spectrum recorded with very low beam energies (i.e.…”

Section: Introductionmentioning

confidence: 99%