We investigate the depth dependency of magnetic species in co-doped dilute magnetic semiconductor (DMS) specimens. We also compare the reliability in nuclear and magnetization depth profile of these specimens at different polarized neutron reflectivity (PNR) instruments. These reflectometers were not only angle dispersive but also wavelength dispersive instrument. Measurements, indicate a segregation of DMS species on to the top into the cap-layer for lower Fe-doping.However, for higher Fe-doping, as we alter the doping concentrations of magnetic species, it indicates no segregation and lower clustering tendencies. Thus sensitive depth-profiling, for specimens with such low magnetic-ion concentrations, may not be a challenge for brighter sources and careful measurements. Our results shows that the homogeneity can be achieved with Fe co-doping within the Ge matrix which can make it a potential candidate for spintronic applications.