1996
DOI: 10.1016/0168-9002(96)00030-7
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Material properties and room-temperature nuclear detector response of wide bandgap semiconductors

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Cited by 23 publications
(7 citation statements)
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“…The development of these devices requires good quality substrates [1]. The common denominator for the room temperature semiconductors, is the difficulty of growing highly crystallographic perfect crystals having high chemical purity and exact stoichiometry [2].…”
Section: Introductionmentioning
confidence: 99%
“…The development of these devices requires good quality substrates [1]. The common denominator for the room temperature semiconductors, is the difficulty of growing highly crystallographic perfect crystals having high chemical purity and exact stoichiometry [2].…”
Section: Introductionmentioning
confidence: 99%
“…Micro-cracks and defects as well as improper passivation can cause high leakage currents, which can degrade the edge-pixel response seriously.The total leakage current of both sensor tiles shows a settling time of several minutes after voltage stepping. This can be an indication for the presence of deep-level defects, which act as trapping centres with a long de-trapping time[11].…”
mentioning
confidence: 99%
“…Studies on a large number of CZT crystals and detectors reveal several problems limiting the device response, such as inhomogeneity of the crystals, excessive trapping of charge, cracking of ingots, and variations in the bulk resistivity. [1][2][3][4][5][6][7][8][9][10][11][12][13][14] The present need for room temperature radiation spectrometers that can resolve the unique radiological emissions of nuclear materials and the clear potential of CZT to satisfy this need has led to a twopronged approach to develop the sensors. A near term effort has focused on optimizing the performance of currently available material by using pulse processing algorithms to mitigate the effects of hole trapping on detector energy resolution [15][16][17] or using electrontransport-only designs that negate most of the effects of hole transport.…”
Section: Introductionmentioning
confidence: 99%
“…[18][19][20][21][22] In parallel, a longer term effort has focused on improving the quality of the material by modifying the growth, purification, and detector processing technology. [1][2][3][4][5][6][7][8][9][10][11][12][13][14] Resolving the problems limiting large volume CZT spectrometers involves advances in the purity, crystallinity, concentration of defects, and control of the electrical compensation mechanism. These are difficult issues, not amenable to quick and simple fixes.…”
Section: Introductionmentioning
confidence: 99%