2012
DOI: 10.1016/j.wear.2012.01.005
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Material removal model for AFM-based nanochannel fabrication

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Cited by 13 publications
(9 citation statements)
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“…Generally, the normal load is considered as the product of the sample yield stress and the horizontal projected area of the tip-sample interface [14][15][16]28]. Based on the horizontal projected area in Fig.…”
Section: The Indentation Testmentioning
confidence: 99%
See 1 more Smart Citation
“…Generally, the normal load is considered as the product of the sample yield stress and the horizontal projected area of the tip-sample interface [14][15][16]28]. Based on the horizontal projected area in Fig.…”
Section: The Indentation Testmentioning
confidence: 99%
“…Recently, some researchers focus on the theoretical modeling of scratching depth. Wang studied the relationship between the initial and final nanochannel depth through both theoretically and experimentally [14,15]. Geng modeled the scratching depth theoretically in both single and multiple scratching, and micro/nano structures were manufactured based on the proposed model [16].…”
Section: Introductionmentioning
confidence: 99%
“…A spherical capped conical tip model has been widely applied in the analysis of the tip-sample interface [10,11], which is shown in Fig. 1, where R 0 is the spherical cap radius and δ is the half angle.…”
Section: Geometrical Modelmentioning
confidence: 99%
“…According to the tip geometry, they can be mainly categorized into spherical tips [8][9][10], conical tips [11,12] and pyramidal tips [13][14][15]. The spherical tip is usually with a diameter in the micron scale, which is not appropriate for the nanochannel fabrication.…”
Section: Introductionmentioning
confidence: 99%
“…Considering the optimization of fabrication methods for precise dimensional control and cost-effectiveness, scanning-probe lithography, which mainly refers to the use of the scanning tunneling microscope and atomic force microscope (AFM) [24][25][26][27][28][29][30] as 'lithographic' tools, is an emerging area in the field of nanofabrication. For example, the diamond tip of a cantilever installed in an AFM is used to mechanically pattern nanoscale features on the surfaces of substrates, such as silicon and metals.…”
Section: Introductionmentioning
confidence: 99%