Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures

Abstract

We propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the case of a thin anisotropic film, the interference effects were described by use of a coherent summation of Jones matrices. Incoherent intensity summations for a thick weakly anisotropic layer were characterized by use of the coherency vector formalism. Observable quantities or Mueller matrix components were obtained from the matrix describing transformation of the coherence vectors.

Influences of thick film inhomogeneities on the ellipsometric parameters

“…The phase relationship is cancelled to some extent due to film imperfections such as lateral inhomogeneities, scattering, or a limited resolution. Various formalisms were proposed for calculation of the partially coherent optical response of multilayered structures [20][21][22].…”

Polarization in France

“…42 In our work, reckoning the balance between reflection and transmission of light striking a nonnormal interface of a medium that is both anisotropic and optically active has been critical. 49 where J is a Jones matrix. 49 where J is a Jones matrix.…”

Gyration and Permittivity of Ethylenediammonium Sulfate Crystals

“…In the thickness regime of 100 microns or more, the multiple internal reflections inside the slab give rise to several superimposed outgoing waves. 41 For very thick crystals measured at oblique incidence, the multiply reflected waves can be spatially resolved and separately measured, but as the HAUP method relies on transmission measurements at normal incidence, the contribution of multiple reflections is unavoidable, and has lead to artifactual oscillations in recovered values of α as a function of temperature. 11,14 Moreover, relying on normal incidence requires that crystals be cut in multiple directions, the number of requisite directions being equal to the number of unique components in α.…”