Measurement Accuracy of Oscillation-Based Test of Analog-to-Digital Converters

Mrak, Peter; Biasizzo, Anton; Novak, Franc

doi:10.4218/etrij.10.0209.0285

Cited by 6 publications

(2 citation statements)

References 6 publications

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“…In the external tester, the oscillation is achieved by an external feedback loop network which is normally implemented as part of a dedicated tester. The OBT technique has been applied to various kinds of analogue and mixed-signal circuits [6][7][8][9][10][11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Hasan

Yanqing

Sun

2017

Circuits Syst Signal Process

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This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and faultfree simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.

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Section: Introductionmentioning

confidence: 99%

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Hasan

Yanqing

Sun

2017

Circuits Syst Signal Process

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“…Analog-to-digital converters (ADCs) which perform signal transfers between the analog and digital domains are considered as the most important devices in systems-on-chips (SoCs) [ 1 ]–[ 3 ]. ADCs have been widely used in applications such as communications, energy, healthcare, instrumentation and measurement, automotive, aerospace, and so on.…”

Section: Introductionmentioning

confidence: 99%

Histogram-Based Calibration Method for Pipeline ADCs

et al. 2015

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Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-based method requires a large volume of data and a long test duration, especially for a high resolution ADC. A fast and accurate calibration method for pipelined ADCs is proposed in this research. The proposed calibration method composes histograms through the outputs of each stage and calculates error sources. The digitized outputs of a stage are influenced directly by the operation of the prior stage, so the results of the histogram provide the information of errors in the prior stage. The composed histograms reduce the required samples and thus calibration time being implemented by simple modules. For 14-bit resolution pipelined ADC, the measured maximum integral non-linearity (INL) is improved from 6.78 to 0.52 LSB, and the spurious-free dynamic range (SFDR) and signal-to-noise-and-distortion ratio (SNDR) are improved from 67.0 to 106.2dB and from 65.6 to 84.8dB, respectively.

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