Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Abstract

This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and faultfree simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

“…This is often augmented by Monte Carlo analysis of both faulty and non-faulty circuits [58] to evaluate the test approach over PVT variation. In this work, only singlecatastrophic faults are considered, as the consideration of parametric faults [30] increases the number of required simulations substantially.…”

“…OBT and OBIST have been applied to a wide variety of analogue and mixed-signal (AMS) CMOS circuits, including operational transimpedance amplifiers (OTAs) [28], [29] and OTA-based filters [30], second-generation current conveyors (CCIIs) [31] and CCII-based filters [32], conventional op-amps [33], switched capacitor filters [34], [35], digital circuits such as digital filters [36], full AMS blocks [37] and phase shifters [38].…”

A Method for Parametric and Catastrophic Fault Diagnosis of Analog Linear Circuits

“…Numerous works in this field are focused on the problem of single fault diagnosis [5]- [7], because this is the most frequent case [8]. The diagnostic methods and techniques are based on circuit theory and signal processing methods [9]- [11], various branches of mathematics [7], [12]- [15], and Artificial Intelligence (AI) concepts [16]- [22].…”

Phase difference analysis technique for parametric faults BIST in CMOS analog circuits

“…Afterwards, the frequency characteristic is simply observed such as amplitude, a center frequency, and distortion. The oscillator-based BIST for the analog filters is proposed in [9,10], the DC gain, ripple, and the cut-off frequency are measured with high faults coverage. However, the pass/fail decision is based on monitoring and observing technique.…”