“…Axially varying material parameters inside a cavity may be resolved by evaluating several cavity resonances [6]. (Note that in many tubular reactors the material parameters are inhomogeneous in the direction of the flow but can be assumed to be homogeneous over the cross-section with little error [1], [2].)…”
Section: The Cavity Resonator Methodsmentioning
confidence: 99%
“…It looks as if VNA A consistently returns resonance frequencies that are slightly too high, which may be a consequence of an offset error in its frequency base. As the fractional frequency deviation is only about 50 ppm (corresponding to 100 kHz for a 2-GHz resonance), the error may be neglected in practice, as reconstruction algorithms can cope with it [6]. Otherwise the error can be compensated in software by simply adding or subtracting an offset to or from the resonance frequency.…”
Section: Comparison With Commercial Vnasmentioning
confidence: 99%
“…The frequencies at which resonances occur are influenced by the electrochemical material parameters inside the cavity. We have dealt with several aspects of this method [6], [7], but the availability of low-cost equipment suitable for field (in-process) use remains an open issue. Potentially viable approaches include the use of mobile-phone equipment [8] and of application-specific scalar network analysis [9].…”
“…Axially varying material parameters inside a cavity may be resolved by evaluating several cavity resonances [6]. (Note that in many tubular reactors the material parameters are inhomogeneous in the direction of the flow but can be assumed to be homogeneous over the cross-section with little error [1], [2].)…”
Section: The Cavity Resonator Methodsmentioning
confidence: 99%
“…It looks as if VNA A consistently returns resonance frequencies that are slightly too high, which may be a consequence of an offset error in its frequency base. As the fractional frequency deviation is only about 50 ppm (corresponding to 100 kHz for a 2-GHz resonance), the error may be neglected in practice, as reconstruction algorithms can cope with it [6]. Otherwise the error can be compensated in software by simply adding or subtracting an offset to or from the resonance frequency.…”
Section: Comparison With Commercial Vnasmentioning
confidence: 99%
“…The frequencies at which resonances occur are influenced by the electrochemical material parameters inside the cavity. We have dealt with several aspects of this method [6], [7], but the availability of low-cost equipment suitable for field (in-process) use remains an open issue. Potentially viable approaches include the use of mobile-phone equipment [8] and of application-specific scalar network analysis [9].…”
“…Ziel ist es, anhand gemessener Resonanzparameter den Segmenten die Materialparameter zuzuordnen. Dazu existieren zwei Verfahren, eines mit [6] und eines ohne Nebenbedingung [5].…”
Section: Problem Der Materialparameterbestimmung 21 Vorwärtsmodellieunclassified
“…Durch sorgfältiges De-Embedding können unbelastete Resonanzparameter (Resonanzfrequenz werden [4]. Anhand der unbelasteten Parameter mehrerer Resonanzen kann auf die Materialparameterverteilung im Resonator rückgerechnet werden [5]. Dabei wird zunächst unterstellt, dass die Materialparameter nur in longitudinaler Richtung (im Beispiel: in Fließrichtung der Reagenzien) variieren, in transversaler Richtung aber als homogen genähert werden können.…”
ZusammenfassungDie quantitative Bestimmung von Materialparameterverläufen in Hohlraumresonatoren ist eine relativ neue Methode zur echtzeitfähigen Überwachung verfahrenstechnischer Prozesse. Dazu werden elektromagnetische Resonanzen des Hohlraumresonators als Eingangsdaten für die Rückrechnung (Inversion) verwendet. Der Rückrechenalgorithmus ist allerdings empfindlich auf Störungen (= Messabweichungen) der Eingangsdaten und neigt zum Divergieren. In dieser Arbeit wird ein auf der Monte-Carlo-Methode beruhender Korrekturalgorithmus präsentiert, der für ein konvergentes Verhalten des Rückrechenalgorithmus sorgt.
A fast and efficient method is proposed in this letter to characterize the dielectric permittivity of thin‐film materials. The measuring system is based on a TE103 rectangular split‐cavity resonator operating at around 10 GHz, which has the advantage of providing nondestructive measurements while maintaining a high level of accuracy. The thin‐film materials under test can be directly inserted in the split without being processed in a specific shape. Different dielectric materials are tested using this method. And the theoretical derivations and experimental measurements have been performed to confirm the validity and effectiveness of this approach.
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