Measurement of transverse piezoelectric properties of PZT thin films

Kanno, Isaku; Kotera, Hidetoshi; Wasa, Kiyotaka

doi:10.1016/s0924-4247(03)00234-6

Cited by 216 publications

(137 citation statements)

References 16 publications

Supporting

Mentioning

128

Contrasting

Order By: Relevance

“…This reveals that the value of the transverse piezoelectric is sensitive to variations in length for the clamped-clamped style devices used. However, the values calculated are significantly greater than those of other efforts [6] to [9] and [11]. In these studies, a Young's modulus value of about 100 GPa was used for the PZT, which is significantly greater than the value used in this study.…”

Section: Resultsmentioning

confidence: 62%

Characterizing Effective d31 Values for PZT from the Nonlinear Oscillations of Clamped-Clamped Micro- Resonators

Dick

2013

SV-JME

View full text Add to dashboard Cite

Section: Resultsmentioning

confidence: 62%

Characterizing Effective d31 Values for PZT from the Nonlinear Oscillations of Clamped-Clamped Micro- Resonators

Dick

2013

SV-JME

View full text Add to dashboard Cite

“…[1][2][3][4] The immense interest in optically active FE materials is due to the presence of strong spontaneous polarization which is necessary for ferroelectric photovoltaic currents, and control of photocurrents using the polarization direction. 5,6 Breaking of inversion symmetry in FE materials develops desirable separation of photo-excited charge carriers and produces photo-voltage higher than the bandgap. 1,3 Generally, metal/ferroelectric/metal device structures not only produce the photo-excited electron-hole pairs but also provide a polarization-induced internal electric field to separate the charge carriers.…”

Section: Introductionmentioning

confidence: 99%

Effect of thickness on dielectric, ferroelectric, and optical properties of Ni substituted Pb(Zr0.2Ti0.8)O3 thin films

Kumari

Ortega

Pradhan

et al. 2015

Journal of Applied Physics

View full text Add to dashboard Cite

(PZTNi30) thin films for various thicknesses, ranging from 5 nm to 400 nm, were fabricated by pulsed laser deposition technique. Giant dielectric dispersion, low dielectric loss, large dielectric constant $1000-1500 from 100 Hz to 100 kHz, and diffused dielectric anomaly near 570-630 K were observed in PZTNi30 thin films. These films show well saturated ferroelectric hysteresis, with large remanent polarization. It also illustrated excellent optical transparency which decreased from 82 to 72% with increasing film thickness from 5 nm to 400 nm for the probe wavelengths ranging from 200 to 1100 nm. A decrease in direct bandgap (E g ) values from 4 eV to 3.4 eV and indirect-E g values from 3.5 eV to 2.9 eV were observed for PZTNi30 thin films with increase in film thickness from 5 nm to 400 nm, respectively. The direct and indirect bandgaps were discussed in context of film thickness and grain size effects. Our investigations on optical properties of PZTNi30 thin films suggest that bandgap can be modified as a function of film thickness which may be useful for readers working to develop novel candidates for ferroelectric photovoltaic. V C 2015 AIP Publishing LLC.

show abstract

“…This result shows the converse piezoelectric effect of the PZT-film [21]. Moreover, there was a deflection as the actuator exhibited the butterfly curve with hysteresis [22].…”

Section: Converse Piezoelectric Effect Of the Pzt Cantilevermentioning

confidence: 68%

Using dynamic force microscopy with piezoelectric cantilever for indentation and high-speed observation

Satoh

Nakahara

Kobayashi

et al. 2017

NOLTA

View full text Add to dashboard Cite

Abstract:We investigate the indentation process of lead zirconate titanate (PZT) cantilever on a nanoscale level and attempt a high-speed observation of the process using dynamic force microscopy (DFM), taking advantage of the converse piezoelectric property of the cantilever. We confirm that the PZT cantilever has a good converse piezoelectric effect, works as an excellent actuator, and can produce an indentation on the polymer film, making it suitable for nanoscale applications. Moreover, for use as an actuator instead of a displacement sensor, the PZT cantilever was incorporated into the feedback control system in dynamic force microscopy (DFM), and could successfully be operated. We attempted a high-speed observation using DFM, and we successfully acquired the topographic image on a 1 × 1 µm scan area within 8.5 seconds.

show abstract

Measurement of transverse piezoelectric properties of PZT thin films

Cited by 216 publications

References 16 publications

Characterizing Effective d31 Values for PZT from the Nonlinear Oscillations of Clamped-Clamped Micro- Resonators

Characterizing Effective d31 Values for PZT from the Nonlinear Oscillations of Clamped-Clamped Micro- Resonators

Effect of thickness on dielectric, ferroelectric, and optical properties of Ni substituted Pb(Zr0.2Ti0.8)O3 thin films

Using dynamic force microscopy with piezoelectric cantilever for indentation and high-speed observation

Contact Info

Product

Resources

About