1996
DOI: 10.1061/(asce)0733-9429(1996)122:6(316)
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Measurements of Erosion of Undisturbed Bottom Sediments with Depth

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Cited by 160 publications
(106 citation statements)
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“…The results of the entrainment flux method provide a starting point to parameterize the critical shear stress of the fluff layer within the numerical model. Empirical methods such as Sedflume (McNeil et al 1996) or based on soil mechanical properties (Winterwerp et al 2012) can be used to determine the critical shear stress of the more consolidated bed underneath the fluff layer.…”
Section: Discussionmentioning
confidence: 99%
“…The results of the entrainment flux method provide a starting point to parameterize the critical shear stress of the fluff layer within the numerical model. Empirical methods such as Sedflume (McNeil et al 1996) or based on soil mechanical properties (Winterwerp et al 2012) can be used to determine the critical shear stress of the more consolidated bed underneath the fluff layer.…”
Section: Discussionmentioning
confidence: 99%
“…Most recently, many other apparatus have been developed primarily to measure sediment erosion. The devices of these types can be named as the Sedflume, the ASSET flume and Erosion Function Apparatus etc [1][2][3].…”
Section: Previous Development Of Erosion Apparatusmentioning
confidence: 99%
“…By means of Sedflume, erosion rates could be measured in the laboratory and field at high shear stresses. It had been used to measure erosion rates of relatively undisturbed sediments in the field [1]. In contrast, the Sedflume measures pure erosion that is scour of bed sediment into suspended load and bed load and subsequent transport of these loads downstream with negligible possibility of deposition in the test section.…”
Section: Previous Development Of Erosion Apparatusmentioning
confidence: 99%
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“…Therefore, different laboratory and in situ devices have been developed to measure the critical shear stresses and/or erosion rates (e.g., [6][7][8][9][10][11][12][13]). For the large majority of these erosion devices, determination of fine sediment stability is restricted to the surface layer.…”
Section: Introductionmentioning
confidence: 99%