2015
DOI: 10.1021/acsnano.5b05151
|View full text |Cite
|
Sign up to set email alerts
|

Mechanical and Electrical Anisotropy of Few-Layer Black Phosphorus

Abstract: We combined reflection difference microscopy, electron transport measurements, and atomic force microscopy to characterize the mechanical and electrical anisotropy of few-layer black phosphorus. We were able to identify the lattice orientations of the two-dimensional material and construct suspended structures aligned with specific crystal axes. The approach allowed us to probe the anisotropic mechanical and electrical properties along each lattice axis in separate measurements. We measured the Young's modulus… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

30
252
2
2

Year Published

2016
2016
2024
2024

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 280 publications
(286 citation statements)
references
References 47 publications
(149 reference statements)
30
252
2
2
Order By: Relevance
“…To validate the multimode resonance determination of crystal orientation, we further independently verify this by using polarized optical reflectance measurements. 34,28,40 The results (Figure 2d) show excellent agreement with the results in Figure 2c. This demonstrates that the spatially-resolved multimode resonances provide a new useful alternative for determining the crystal orientation, in situ, in the device platform of suspended black P nanostructures.…”
supporting
confidence: 81%
See 3 more Smart Citations
“…To validate the multimode resonance determination of crystal orientation, we further independently verify this by using polarized optical reflectance measurements. 34,28,40 The results (Figure 2d) show excellent agreement with the results in Figure 2c. This demonstrates that the spatially-resolved multimode resonances provide a new useful alternative for determining the crystal orientation, in situ, in the device platform of suspended black P nanostructures.…”
supporting
confidence: 81%
“…28 However, unlike in Si (where the crystal orientation is always indicated by the cuts on Si wafers with good precision), 5 such information is not readily available for 2D nanocrystals, and complete mechanical decoupling between the two axes has not yet been achieved. 28 In this work, enabled by the first demonstration of black P resonant nanostructures with multimode responses, we show that the spatial mapping of the multimode resonance mode shapes creates a new means for the precise determination of black P crystal orientation (i.e., the Wang Z.H., Jia H., Zheng X.-Q., Yang R., Ye G.J., Chen X.H., Feng P.X.-L., Nano Letters 16, 5394-5400 (2016) [Accepted Version] DOI: 10.1021/acs.nanolett.6b01598, Online Publication: August 9, 2016-3-anisotropic zigzag and armchair axes). This is completely independent of conventional optical and electrical methods that require either polarized optical spectroscopic measurements 29 , 30 , 31 , 32 , 33 , 34 or device structures with many electrodes along multiple directions.…”
mentioning
confidence: 99%
See 2 more Smart Citations
“…1 Phosphorene (PE) [1][2][3] -the crystalline two-dimensional (2D) material exfoliated from black phosphorous (BP) [4] -is attracting tremendous interest due to its exceptional electrical attributes, which include a high hole mobility (∼1,000 cm 2 /Vs) [1], and its unique anisotropic in-plane mechanical, optical and thermal properties [5][6][7][8][9][10][11][12][13]. If strain is introduced in PE, further tuning of its exceptional properties can be achieved [14][15][16][17].…”
mentioning
confidence: 99%