2015
DOI: 10.2494/photopolymer.28.653
|View full text |Cite
|
Sign up to set email alerts
|

Mechanism investigation of filtration on metal and gel removal from DSAL resist

Abstract: Reduction of impurities such as gels and metals is one of the critical requirements in chemistries used in directed self assembly lithography (DSAL). In this study, we focused on elucidating the forms of the gels and metals in block copolymer (BCP) solution to effectively reduce these impurities. As a result, particles or gels, and ions are suggested as forms of metals. To reduce these multiple forms of metals, multistep filtrations such as repetitive filtration of single filter material and combination of dif… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2016
2016
2020
2020

Publication Types

Select...
3
1

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 5 publications
0
3
0
Order By: Relevance
“…It is very important to reduce the defects and improve the yield in leading-edge semiconductor manufacturing processes [1][2][3]. For the reduction of defects, removal of the contamination source by filtration is effective, and filter makers are working to improve the filtering performance by decreasing the pore size and imparting adsorption property to the membrane [4,5].…”
Section: Introductionmentioning
confidence: 99%
“…It is very important to reduce the defects and improve the yield in leading-edge semiconductor manufacturing processes [1][2][3]. For the reduction of defects, removal of the contamination source by filtration is effective, and filter makers are working to improve the filtering performance by decreasing the pore size and imparting adsorption property to the membrane [4,5].…”
Section: Introductionmentioning
confidence: 99%
“…In the semiconductor device manufacturing process, reduction of defects is required to improve performance and yield, and reduce costs. Filtration of photoresist using filter media is effective for reducing defects [1][2][3]. Generally, the material of the filter media for semiconductors is (PE) polyethylene, (PTFE) polytetrafluoroethylene, or nylon, and the manufacturing method of the polymer porous membrane is the phase separation method or the stretching method [4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…We have investigated PS-b-PMMA block copolymer (BCP) filtration in terms of its impact on the polymer characteristics and gel/metal reduction [3][4][5][6], because BCPs employed in DSAL are considerably different from conventional chemically amplified resists (CAR). We have found the filtration using Nylon 6,6 filter is the most effective among other membrane materials for reducing gels, which is probably derived from insufficient solubility of substantially large molecular weight of the BCPs.…”
Section: Introductionmentioning
confidence: 99%