2000
DOI: 10.2172/750344
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MEMS Reliability: Infrastructure, Test Structures, Experiments, and Failure Modes

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Cited by 88 publications
(55 citation statements)
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“…Together with the ultralow friction, this self-repairing mechanism makes MWNTs even more attractive as constitutive elements in nanoelectromechanical systems (NEMS), and much more suitable for this purpose than, for example, silicon (Tanner et al 2000).…”
Section: (C ) Mechanical Measurements: Interlayer Forcementioning
confidence: 99%
“…Together with the ultralow friction, this self-repairing mechanism makes MWNTs even more attractive as constitutive elements in nanoelectromechanical systems (NEMS), and much more suitable for this purpose than, for example, silicon (Tanner et al 2000).…”
Section: (C ) Mechanical Measurements: Interlayer Forcementioning
confidence: 99%
“…Wear and damage to contact conjunctions in loadbearing surfaces, such as meshing gear teeth of micro-electromechanical devices has become a major concern and a stumbling block in technological advances in the field [1,2]. The principal sources of the problem are adhesion of surfaces and ingression of moisture into the contact, both of which can cause damage to the rough-cut surfaces of the usual silica substrate.…”
Section: Introductionmentioning
confidence: 99%
“…To avoid this problem, an expensive solution is to place telescopes in space (such as Hubble). Another interesting and least expensive solution for its ability to use large telescopes, not limited by the dimensions that can be handled in space transport, is what brought the development of mirrors whose surface is deformed by MEMS, correcting distortions produced by the atmosphere land (Tanner et al, 2000). Another scientific application of MEMS was the realization of instruments for measuring forces between two objects whose surfaces are at submicron distances (<1um).…”
Section: Operations Of Memsmentioning
confidence: 99%
“…For this reason MEMS presents deterioration in the electrical connections, and originates electrical failures, and it is not detected until are checked in the last steps of the manufacturing process or when buyers are used, causing economic losses. In base of this, an analyss was made to know the behaviour of corrosion phenomena in the MEMS used in the development of new technologies in the electronics, mechanical and electromechanical systems (Tanner et al, 2000).…”
Section: Introductionmentioning
confidence: 99%