Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films

Goudeau, P.; Villain, P.; Tamura, Nobumichi; Padmore, H. A.

doi:10.1063/1.1591081

Cited by 25 publications

(18 citation statements)

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“…Thin film buckling is observed over 150 nm film thickness. 29 Phase analysis by XRD measurements shows that W crystallites exhibit two different phases: the equilibrium pure W phase, called a-W which has a bodycentered cubic-bcc-structure (space group Im-3 m) and a second one called b-W having an A15 cubic structure (space group Pm-3n) which is stabilized by a low impurity (O, C) concentration. 30 The volume fraction of the b-W phase has been estimated to be about 10% by the method given in Ref.…”

Section: Pure W Thin Filmmentioning

confidence: 99%

Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates

Djaziri

Renault

Bourhis

et al. 2014

Journal of Applied Physics

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International audienceComparative studies of the mechanical behavior between copper, tungsten, and W/Cu nanocomposite based on copper dispersoid thin films were performed under in-situ controlled tensile equi-biaxial loadings using both synchrotron X-ray diffraction and digital image correlation techniques. The films first deform elastically with the lattice strain equal to the true strain given by digital image correlation measurements. The Cu single thin film intrinsic elastic limit of 0.27% is determined below the apparent elastic limit of W and W/Cu nanocomposite thin films, 0.30% and 0.49%, respectively. This difference is found to be driven by the existence of as-deposited residual stresses. Above the elastic limit on the lattice strain-true strain curves, we discriminate two different behaviors presumably footprints of plasticity and fracture. The Cu thin film shows a large transition domain (0.60% true strain range) to a plateau with a smooth evolution of the curve which is associated to peak broadening. In contrast, W and W/Cu nanocomposite thin films show a less smooth and reduced transition domain (0.30% true strain range) to a plateau with no peak broadening. These observations indicate that copper thin film shows some ductility while tungsten/copper nanocomposites thin films are brittle. Fracture resistance of W/Cu nanocomposite thin film is improved thanks to the high compressive residual stress and the elimination of the metastable beta-W phase

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Section: Pure W Thin Filmmentioning

confidence: 99%

Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates

Djaziri

Renault

Bourhis

et al. 2014

Journal of Applied Physics

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“…Stress in the buckled film is distributed nonhomogeneously so that in regions adherent to the substrate, the stress may be high, while top regions are less stressed. 16 Evolution of stress magnitude and density in BTO s-s films with thermal annealing was investigated. Our findings are as follows:…”

Section: Stress Relaxation By Shape Changementioning

confidence: 99%

Strain-arranged structure in amorphous films

et al. 2012

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“…Today, most synchrotron facilities can provide such a small beam size in a routine manner (Tamura et al, 2002;Ice et al, 2011;Bertrand et al, 2012), which has opened new possibilities for structural mapping of heterogeneous samples. In particular, X-ray powder diffraction imaging has been extensively used in several area of materials science (Goudeau et al, 2003;Xu et al, 2012;Vaxelaire et al, 2014), including the study of ancient artefacts (Dooryhé e et al, 2005;De Nolf & Janssens, 2010).…”

Section: Introductionmentioning

confidence: 99%

Complementary use of monochromatic and white-beam X-ray micro-diffraction for the investigation of ancient materials

et al. 2015

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Archaeological artefacts are often heterogeneous materials where several phases coexist in a wide grain size distribution. Most of the time, retrieving structure information at the micrometre scale is of great importance for these materials. Particularly, the organization of different phases at the micrometre scale is closely related to optical or mechanical properties, manufacturing processes, functionalities in ancient times and long-term conservation. Between classic X-ray powder diffraction with a millimetre beam and transmission electron microscopy, a gap exists and structure and phase information at the micrometre scale are missing. Using a micrometre-size synchrotron X-ray beam, a hybrid approach combining both monochromatic powder micro-diffraction and Laue single-crystal micro-diffraction was deployed to obtain information from nanometre-and micrometre-size phases, respectively. Therefore providing a way to bridge the aforementioned gap, this unique methodology was applied to three different types of ancient materials that all show a strong heterogeneity. In Roman terra sigillata, the specific distribution of nanocrystalline hematite is mainly responsible for the deep-red tone of the slip, while the distribution of micrometre-size quartz in ceramic bodies reflects the change of manufacturing process between pre-sigillata and high-quality sigillata periods. In the second example, we investigated the modifications occurring in Neolithic and geological flints after a heating process. By separating the diffracted signal coming from the nano-and the micrometre scale, we observed a domain size increase for nanocrystalline quartz in geological flints and a relaxation of the residual strain in larger detritic quartz. Finally, through the study of a Roman iron nail, we showed that the carburation process to strengthen the steel was mainly a surface process that formed 10-20 mm size domains of single-crystal ferrite and nanocrystalline cementite.

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Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films

Cited by 25 publications

References 20 publications

Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates

Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates

Strain-arranged structure in amorphous films

Complementary use of monochromatic and white-beam X-ray micro-diffraction for the investigation of ancient materials

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